JPS5779463A - Internal abnormality detector for electric equipment - Google Patents
Internal abnormality detector for electric equipmentInfo
- Publication number
- JPS5779463A JPS5779463A JP55156148A JP15614880A JPS5779463A JP S5779463 A JPS5779463 A JP S5779463A JP 55156148 A JP55156148 A JP 55156148A JP 15614880 A JP15614880 A JP 15614880A JP S5779463 A JPS5779463 A JP S5779463A
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- corresponds
- signal
- short
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Housings And Mounting Of Transformers (AREA)
- Protection Of Transformers (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
PURPOSE:To take a countermeasure to an accident before electric equipment breaks down thermally, by finding an internal fault in its early stage by detecting a rise in the internal temperature of the electrical equipment due to local heat generation through continuous monitoring by infrared-ray irradiation. CONSTITUTION:If the short-circuit part 7 of a mode coil 1 causes a short circuit, the temperature of the short-circuit part 7 rises, so thermal radiation which corresponds to the temperature is performed to radiate infrared rays 8. Those infrared rays 8 are inputted to a heat-sensitive detecting element 2 to be converted into an electric temperature signal which corresponds to its intensity, thereby supplying the signal to an output part 4. The output part 4 has a set temperature signal which corresponds to the upper limit temperature of the mode coil 1 and when an input signal higher than the set temperature signal is applied from an amplification part 3, the occurrence of the internal fault is discriminated. Thus, a necessary countermeasure to an accident is taken accurately before thermal destruction due to the short circuit of the coil 1 occurs.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55156148A JPS5779463A (en) | 1980-11-06 | 1980-11-06 | Internal abnormality detector for electric equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55156148A JPS5779463A (en) | 1980-11-06 | 1980-11-06 | Internal abnormality detector for electric equipment |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5779463A true JPS5779463A (en) | 1982-05-18 |
Family
ID=15621377
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55156148A Pending JPS5779463A (en) | 1980-11-06 | 1980-11-06 | Internal abnormality detector for electric equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5779463A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2001007901A1 (en) * | 1999-07-23 | 2001-02-01 | Telcordia Technologies, Inc. | Infrared thermographic method for process monitoring and control of multilayer conductive compositions |
-
1980
- 1980-11-06 JP JP55156148A patent/JPS5779463A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2001007901A1 (en) * | 1999-07-23 | 2001-02-01 | Telcordia Technologies, Inc. | Infrared thermographic method for process monitoring and control of multilayer conductive compositions |
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