JPS5767808A - Measuring device for thickness and shape of plate - Google Patents

Measuring device for thickness and shape of plate

Info

Publication number
JPS5767808A
JPS5767808A JP14466880A JP14466880A JPS5767808A JP S5767808 A JPS5767808 A JP S5767808A JP 14466880 A JP14466880 A JP 14466880A JP 14466880 A JP14466880 A JP 14466880A JP S5767808 A JPS5767808 A JP S5767808A
Authority
JP
Japan
Prior art keywords
thickness
plate
scintillator
measured
width direction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14466880A
Other languages
Japanese (ja)
Inventor
Tatsuo Tsujii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP14466880A priority Critical patent/JPS5767808A/en
Publication of JPS5767808A publication Critical patent/JPS5767808A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)

Abstract

PURPOSE:To measure the thickness in a width direction in a short time without any limitation in measurement pitch by disposing a bar-like scintillator in the width direction of a plate to be measured, scanning the light that the scintillator emits by the radiation transmitted through said plate and detecting the thickness. CONSTITUTION:A radiation beam of a fan shape radiated from a radiation source 24 transmits through a plate 22 to be measured and is made incident to a bar-like scintillator 25. The light emitted by the scintillator 25 is scanned by an optical scanner 26 such as rotary mirror, and is detected by a photoelectric multiplier 27. A measuring position signal 29 is applied from the scanner 26 to a signal processing part 28, which determines the plate thickness corresponding to each position by receiving the signal from the multiplier 27. The thickness is displayed in a display part 30. Thereby, the thickness in the width direction is measured in a short time without any limitation of measurement pitches.
JP14466880A 1980-10-16 1980-10-16 Measuring device for thickness and shape of plate Pending JPS5767808A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14466880A JPS5767808A (en) 1980-10-16 1980-10-16 Measuring device for thickness and shape of plate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14466880A JPS5767808A (en) 1980-10-16 1980-10-16 Measuring device for thickness and shape of plate

Publications (1)

Publication Number Publication Date
JPS5767808A true JPS5767808A (en) 1982-04-24

Family

ID=15367448

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14466880A Pending JPS5767808A (en) 1980-10-16 1980-10-16 Measuring device for thickness and shape of plate

Country Status (1)

Country Link
JP (1) JPS5767808A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59154604U (en) * 1983-03-31 1984-10-17 株式会社東芝 Profile continuous measurement device
JPS59154605U (en) * 1983-03-31 1984-10-17 株式会社東芝 Profile continuous measurement device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59154604U (en) * 1983-03-31 1984-10-17 株式会社東芝 Profile continuous measurement device
JPS59154605U (en) * 1983-03-31 1984-10-17 株式会社東芝 Profile continuous measurement device

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