JPS5764704U - - Google Patents
Info
- Publication number
- JPS5764704U JPS5764704U JP14048180U JP14048180U JPS5764704U JP S5764704 U JPS5764704 U JP S5764704U JP 14048180 U JP14048180 U JP 14048180U JP 14048180 U JP14048180 U JP 14048180U JP S5764704 U JPS5764704 U JP S5764704U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- A Measuring Device Byusing Mechanical Method (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14048180U JPS5764704U (en) | 1980-10-03 | 1980-10-03 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14048180U JPS5764704U (en) | 1980-10-03 | 1980-10-03 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5764704U true JPS5764704U (en) | 1982-04-17 |
Family
ID=29500391
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14048180U Pending JPS5764704U (en) | 1980-10-03 | 1980-10-03 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5764704U (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS593301A (en) * | 1982-06-30 | 1984-01-10 | Toshiba Corp | Device for measuring distance between two parallel planes having level difference |
JPS61292010A (en) * | 1985-06-19 | 1986-12-22 | Toshiba Corp | Measuring instrument for deviation for stack thickness |
KR101259303B1 (en) | 2011-09-23 | 2013-05-06 | 주식회사 포스코 | Apparatus for measurement level of laminates |
-
1980
- 1980-10-03 JP JP14048180U patent/JPS5764704U/ja active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS593301A (en) * | 1982-06-30 | 1984-01-10 | Toshiba Corp | Device for measuring distance between two parallel planes having level difference |
JPS61292010A (en) * | 1985-06-19 | 1986-12-22 | Toshiba Corp | Measuring instrument for deviation for stack thickness |
KR101259303B1 (en) | 2011-09-23 | 2013-05-06 | 주식회사 포스코 | Apparatus for measurement level of laminates |