JPS5758762Y2 - - Google Patents
Info
- Publication number
- JPS5758762Y2 JPS5758762Y2 JP13346976U JP13346976U JPS5758762Y2 JP S5758762 Y2 JPS5758762 Y2 JP S5758762Y2 JP 13346976 U JP13346976 U JP 13346976U JP 13346976 U JP13346976 U JP 13346976U JP S5758762 Y2 JPS5758762 Y2 JP S5758762Y2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13346976U JPS5758762Y2 (en:Method) | 1976-10-04 | 1976-10-04 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13346976U JPS5758762Y2 (en:Method) | 1976-10-04 | 1976-10-04 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5351183U JPS5351183U (en:Method) | 1978-05-01 |
| JPS5758762Y2 true JPS5758762Y2 (en:Method) | 1982-12-15 |
Family
ID=28742440
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13346976U Expired JPS5758762Y2 (en:Method) | 1976-10-04 | 1976-10-04 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5758762Y2 (en:Method) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6130281Y2 (en:Method) * | 1980-08-21 | 1986-09-05 |
-
1976
- 1976-10-04 JP JP13346976U patent/JPS5758762Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5351183U (en:Method) | 1978-05-01 |