JPS5753956A - - Google Patents
Info
- Publication number
- JPS5753956A JPS5753956A JP56117221A JP11722181A JPS5753956A JP S5753956 A JPS5753956 A JP S5753956A JP 56117221 A JP56117221 A JP 56117221A JP 11722181 A JP11722181 A JP 11722181A JP S5753956 A JPS5753956 A JP S5753956A
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US06/173,445 US4429275A (en) | 1980-07-30 | 1980-07-30 | Handling and test apparatus for radial lead electronic devices |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5753956A true JPS5753956A (ja) | 1982-03-31 |
Family
ID=22632066
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56117221A Pending JPS5753956A (ja) | 1980-07-30 | 1981-07-28 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US4429275A (ja) |
| JP (1) | JPS5753956A (ja) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4509010A (en) * | 1982-12-27 | 1985-04-02 | Cedrone Nicholas J | Lead combing apparatus for radial lead electronic devices |
| US5061895A (en) * | 1990-01-19 | 1991-10-29 | Vlsi Technology, Inc. | System for detecting and correcting misalignment of semiconductor package leads |
| US5381585A (en) * | 1993-07-23 | 1995-01-17 | Vlsi Technology, Inc. | Docking handle |
| US5488292A (en) * | 1993-10-04 | 1996-01-30 | Tokyo Seimitsu Co., Ltd. | Wafer inspecting system |
| CN102290178B (zh) * | 2011-04-18 | 2013-04-03 | 上海理工大学 | 一种多功能电阻成型机 |
| US9810520B2 (en) | 2015-10-05 | 2017-11-07 | General Electric Company | Measuring relative concentricity deviations in a confined space between two circumferential elements |
| US10030961B2 (en) | 2015-11-27 | 2018-07-24 | General Electric Company | Gap measuring device |
| CN106670350A (zh) * | 2017-01-10 | 2017-05-17 | 苏州同为精密机械有限公司 | 一种多功能电子元件成型机 |
| US11592477B2 (en) * | 2019-04-29 | 2023-02-28 | Asmpt Singapore Pte. Ltd. | Test handler having multiple testing sectors |
| CN114769165B (zh) * | 2022-06-20 | 2022-09-16 | 杭州宇称电子技术有限公司 | 一种用于高性能单光子探测芯片检测设备及方法 |
-
1980
- 1980-07-30 US US06/173,445 patent/US4429275A/en not_active Expired - Lifetime
-
1981
- 1981-07-28 JP JP56117221A patent/JPS5753956A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| US4429275A (en) | 1984-01-31 |