JPS57500489A - - Google Patents

Info

Publication number
JPS57500489A
JPS57500489A JP56501470A JP50147081A JPS57500489A JP S57500489 A JPS57500489 A JP S57500489A JP 56501470 A JP56501470 A JP 56501470A JP 50147081 A JP50147081 A JP 50147081A JP S57500489 A JPS57500489 A JP S57500489A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56501470A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS57500489A publication Critical patent/JPS57500489A/ja
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L9/00—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means
    • G01L9/02—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means by making use of variations in ohmic resistance, e.g. of potentiometers, electric circuits therefor, e.g. bridges, amplifiers or signal conditioning
    • G01L9/04—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means by making use of variations in ohmic resistance, e.g. of potentiometers, electric circuits therefor, e.g. bridges, amplifiers or signal conditioning of resistance-strain gauges
    • G01L9/045—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means by making use of variations in ohmic resistance, e.g. of potentiometers, electric circuits therefor, e.g. bridges, amplifiers or signal conditioning of resistance-strain gauges with electric temperature compensating means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
    • G01D3/036—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
    • H03F1/30—Modifications of amplifiers to reduce influence of variations of temperature or supply voltage or other physical parameters
    • H03F1/302—Modifications of amplifiers to reduce influence of variations of temperature or supply voltage or other physical parameters in bipolar transistor amplifiers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measuring Fluid Pressure (AREA)
  • Amplifiers (AREA)
JP56501470A 1980-04-14 1981-03-16 Pending JPS57500489A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/140,070 US4326171A (en) 1980-04-14 1980-04-14 Temperature compensating pressure sensor amplifier circuits

Publications (1)

Publication Number Publication Date
JPS57500489A true JPS57500489A (ja) 1982-03-18

Family

ID=22489610

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56501470A Pending JPS57500489A (ja) 1980-04-14 1981-03-16

Country Status (7)

Country Link
US (1) US4326171A (ja)
EP (1) EP0050135A4 (ja)
JP (1) JPS57500489A (ja)
KR (1) KR830005760A (ja)
BR (1) BR8108440A (ja)
IT (1) IT1170872B (ja)
WO (1) WO1981003094A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4986131A (en) * 1988-12-28 1991-01-22 Kabushiki Kaisha Toyota Chuo Kenkyusho Semiconductor strain detector

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4478527A (en) * 1982-12-02 1984-10-23 General Signal Corporation Temperature compensation for zero and span changes in a measurement circuit
US4546320A (en) * 1984-02-16 1985-10-08 The United States Of America As Represented By The Secretary Of The Air Force Total temperature probe buffer amplifier
DE3503489A1 (de) * 1985-01-30 1986-07-31 Siemens AG, 1000 Berlin und 8000 München Schaltungsanordnung zur kompensation der temperaturabhaengigkeit von empfindlichkeit und nullpunkt eines piezoresistiven drucksensors
US5184520A (en) * 1989-10-18 1993-02-09 Ishida Scales Mfg. Co., Ltd. Load sensor
US5050423A (en) * 1989-12-04 1991-09-24 Motorola, Inc. Multi-variable sensor calibration
US5414441A (en) * 1991-01-11 1995-05-09 Ncr Corporation Temperature compensation apparatus for liquid crystal display
US5361637A (en) * 1992-11-06 1994-11-08 Mks Instruments, Inc. Temperature compensation circuitry employing a single temperature compensation element
US5440935A (en) * 1993-03-18 1995-08-15 Mts Systems Corporation Apparatus for combining transducer output signals
CA2145697A1 (en) * 1994-04-15 1995-10-16 Michael F. Mattes Method and apparatus for compensating for temperature fluctuations in the input to a gain circuit
US5759870A (en) * 1995-08-28 1998-06-02 Bei Electronics, Inc. Method of making a surface micro-machined silicon pressure sensor
EP0913677B1 (en) * 1997-10-28 2003-08-27 Toyoda Koki Kabushiki Kaisha Pressure detection device
US7340366B2 (en) * 2004-03-04 2008-03-04 Atmel Corporation Method and apparatus of temperature compensation for integrated circuit chip using on-chip sensor and computation means
TWI230851B (en) * 2004-03-29 2005-04-11 Asia Vital Components Co Ltd Circuit structure to adjust the slope of output versus temperature variation

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3967188A (en) * 1973-05-24 1976-06-29 Bell & Howell Company Temperature compensation circuit for sensor of physical variables such as temperature and pressure
US3841150A (en) * 1973-11-02 1974-10-15 Honeywell Inc Strain gauge transducer signal conditioning circuitry
GB1591620A (en) * 1976-12-21 1981-06-24 Nat Res Dev Signal-conditioning circuits
DE2839617C2 (de) * 1978-09-12 1984-11-29 Siemens AG, 1000 Berlin und 8000 München Meßanordnung

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4986131A (en) * 1988-12-28 1991-01-22 Kabushiki Kaisha Toyota Chuo Kenkyusho Semiconductor strain detector

Also Published As

Publication number Publication date
US4326171A (en) 1982-04-20
IT1170872B (it) 1987-06-03
EP0050135A4 (en) 1983-11-21
IT8148200A0 (it) 1981-04-03
EP0050135A1 (en) 1982-04-28
WO1981003094A1 (en) 1981-10-29
KR830005760A (ko) 1983-09-09
BR8108440A (pt) 1982-03-09

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