JPS5729099B2 - - Google Patents
Info
- Publication number
- JPS5729099B2 JPS5729099B2 JP8937176A JP8937176A JPS5729099B2 JP S5729099 B2 JPS5729099 B2 JP S5729099B2 JP 8937176 A JP8937176 A JP 8937176A JP 8937176 A JP8937176 A JP 8937176A JP S5729099 B2 JPS5729099 B2 JP S5729099B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Dc Digital Transmission (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8937176A JPS5315175A (en) | 1976-07-27 | 1976-07-27 | Jitter measuring instrument |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8937176A JPS5315175A (en) | 1976-07-27 | 1976-07-27 | Jitter measuring instrument |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5315175A JPS5315175A (en) | 1978-02-10 |
| JPS5729099B2 true JPS5729099B2 (en) | 1982-06-21 |
Family
ID=13968825
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8937176A Granted JPS5315175A (en) | 1976-07-27 | 1976-07-27 | Jitter measuring instrument |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5315175A (en) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5923504B2 (en) * | 1977-08-31 | 1984-06-02 | 富士通株式会社 | High-speed jitter measurement device |
| JPS55145461A (en) * | 1979-04-27 | 1980-11-13 | Nec Corp | Digital signal/noise ratio monitoring device |
| US4876655A (en) * | 1985-12-02 | 1989-10-24 | Tektronix, Inc. | Method and apparatus for evaluating jitter |
| JP3221401B2 (en) | 1998-06-15 | 2001-10-22 | 日本電気株式会社 | Optical signal monitoring method and apparatus |
| KR100458106B1 (en) | 2000-07-10 | 2004-11-26 | 인터내셔널 비지네스 머신즈 코포레이션 | Apparatus and method for determining the quality of a digital signal |
| DE10197038B4 (en) * | 2000-12-11 | 2008-01-31 | Advantest Corp. | Quiver size and tester calculating device |
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1976
- 1976-07-27 JP JP8937176A patent/JPS5315175A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5315175A (en) | 1978-02-10 |