JPS57211530A - Inspection device for detecting oprical pollution - Google Patents

Inspection device for detecting oprical pollution

Info

Publication number
JPS57211530A
JPS57211530A JP57093257A JP9325782A JPS57211530A JP S57211530 A JPS57211530 A JP S57211530A JP 57093257 A JP57093257 A JP 57093257A JP 9325782 A JP9325782 A JP 9325782A JP S57211530 A JPS57211530 A JP S57211530A
Authority
JP
Japan
Prior art keywords
oprical
pollution
detecting
inspection device
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57093257A
Other languages
English (en)
Inventor
Teii Kaan Maaku
Jiei Shinzoori Robaato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Raytheon Co
Original Assignee
Santa Barbara Research Center
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Santa Barbara Research Center filed Critical Santa Barbara Research Center
Publication of JPS57211530A publication Critical patent/JPS57211530A/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/05Means for preventing contamination of the components of the optical system; Means for preventing obstruction of the radiation path
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59Transmissivity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/0228Control of working procedures; Failure detection; Spectral bandwidth calculation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/08Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/026Control of working procedures of a pyrometer, other than calibration; Bandwidth calculation; Gain control
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/04Casings
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/08Optical arrangements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/08Optical arrangements
    • G01J5/0801Means for wavelength selection or discrimination
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/08Optical arrangements
    • G01J5/0896Optical arrangements using a light source, e.g. for illuminating a surface
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/90Testing, inspecting or checking operation of radiation pyrometers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Measurement Of Radiation (AREA)
JP57093257A 1981-06-02 1982-06-02 Inspection device for detecting oprical pollution Pending JPS57211530A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US26921081A 1981-06-02 1981-06-02

Publications (1)

Publication Number Publication Date
JPS57211530A true JPS57211530A (en) 1982-12-25

Family

ID=23026275

Family Applications (2)

Application Number Title Priority Date Filing Date
JP57093257A Pending JPS57211530A (en) 1981-06-02 1982-06-02 Inspection device for detecting oprical pollution
JP1992034710U Pending JPH04131758U (ja) 1981-06-02 1992-05-25 光学的汚れを検出するための検査装置

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP1992034710U Pending JPH04131758U (ja) 1981-06-02 1992-05-25 光学的汚れを検出するための検査装置

Country Status (6)

Country Link
EP (1) EP0066370A1 (ja)
JP (2) JPS57211530A (ja)
KR (1) KR880001336B1 (ja)
AU (1) AU557257B2 (ja)
IL (1) IL65575A0 (ja)
IN (1) IN158131B (ja)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2141228B (en) * 1983-06-09 1987-01-07 Shorrock Security Systems Ltd Infra-red intrusion detector
FR2574200B1 (fr) * 1984-11-30 1987-01-23 Labo Electronique Physique Dispositif de detection d'intrus muni d'un dispositif d'antimasquage
DE3573670D1 (en) * 1985-01-08 1989-11-16 Cerberus Ag Infrared intrusion detector
GB2175686A (en) * 1985-05-28 1986-12-03 Graviner Ltd Fire or explosion detection arrangement
EP0219711A1 (de) * 1985-10-08 1987-04-29 Heimann GmbH Infrarotdetektor

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50103384A (ja) * 1974-01-14 1975-08-15
JPS5220282B2 (ja) * 1973-12-13 1977-06-02
JPS5432955U (ja) * 1977-08-09 1979-03-03

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE754420A (fr) * 1969-08-06 1971-01-18 Degussa Procede pour la preparation de 4-ureidohexahydropyrimidinone -(2)
GB1395113A (en) * 1973-03-16 1975-05-21 Standard Telephones Cables Ltd Detecting obscuring matter on transparent screens
JPS50106404A (ja) * 1974-01-29 1975-08-21
US4188533A (en) * 1978-01-09 1980-02-12 The Boeing Company Window transmittance tester
JPS54147094A (en) * 1978-05-11 1979-11-16 Inoue Japax Res Device for judging property of fluid
DE2833635C2 (de) * 1978-08-01 1983-05-05 Siemens AG, 1000 Berlin und 8000 München Verfahren zur Messung der Verschmutzung von optischen Grenzflächen bei optischen Empfängern und Einrichtung zur Durchführung des Verfahrens

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5220282B2 (ja) * 1973-12-13 1977-06-02
JPS50103384A (ja) * 1974-01-14 1975-08-15
JPS5432955U (ja) * 1977-08-09 1979-03-03

Also Published As

Publication number Publication date
AU557257B2 (en) 1986-12-18
AU8438282A (en) 1982-12-09
KR880001336B1 (ko) 1988-07-25
IL65575A0 (en) 1982-07-30
JPH04131758U (ja) 1992-12-04
IN158131B (ja) 1986-09-13
KR830010379A (ko) 1983-12-30
EP0066370A1 (en) 1982-12-08

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