JPS57206802A - Alignment device - Google Patents

Alignment device

Info

Publication number
JPS57206802A
JPS57206802A JP56069364A JP6936481A JPS57206802A JP S57206802 A JPS57206802 A JP S57206802A JP 56069364 A JP56069364 A JP 56069364A JP 6936481 A JP6936481 A JP 6936481A JP S57206802 A JPS57206802 A JP S57206802A
Authority
JP
Japan
Prior art keywords
pattern
target
circular
signal
housing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56069364A
Other languages
Japanese (ja)
Other versions
JPS6248161B2 (en
Inventor
Shigeo Sasaki
Shigeru Ogawa
Katsuyoshi Tamaki
Masumi Yamano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP56069364A priority Critical patent/JPS57206802A/en
Publication of JPS57206802A publication Critical patent/JPS57206802A/en
Publication of JPS6248161B2 publication Critical patent/JPS6248161B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • G01B11/272—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes using photoelectric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To enable to perform a high-precise and self-finding of a center coordinate of a plural number of circular holes to be aligned, by a method wherein a target, having a circular pattern, is mounted to a target member to process the image signal of said pattern. CONSTITUTION:An axial line of a housing 2 for driving a control rod secured to a bottom plate 6 of a pressure container coincides with that of a circular hole 4. After an optical collimator 13, placed on the circular hole 4, is levelled by a circular air bubble tube 24, disc-shaped targets 10-12 mate the housing and are irradiated with light from a lamp 6. Concentrifugal patterns 18 and 19 are formed on each target, and a video signal SA is obtained by an ITV camera 14. In a pattern picture on monitors 31-33, electronic line signals HS, HE, HS, and VE are outputted from a controller 25 to a computing part 28 so that the signals surrounds a pattern picture 19. From a signal corresponding to a pattern of a part surrounded with each line signal, a center coordinate of each target is computed.
JP56069364A 1981-05-11 1981-05-11 Alignment device Granted JPS57206802A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56069364A JPS57206802A (en) 1981-05-11 1981-05-11 Alignment device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56069364A JPS57206802A (en) 1981-05-11 1981-05-11 Alignment device

Publications (2)

Publication Number Publication Date
JPS57206802A true JPS57206802A (en) 1982-12-18
JPS6248161B2 JPS6248161B2 (en) 1987-10-13

Family

ID=13400421

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56069364A Granted JPS57206802A (en) 1981-05-11 1981-05-11 Alignment device

Country Status (1)

Country Link
JP (1) JPS57206802A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60256002A (en) * 1984-06-01 1985-12-17 Nippon Kogaku Kk <Nikon> Position detecting apparatus
JP2006337293A (en) * 2005-06-06 2006-12-14 Sekisui Chem Co Ltd Sighting device
FR3105049A1 (en) * 2019-12-19 2021-06-25 Sarl Metromecanica BORE ALIGNMENT CONTROL AND ADJUSTMENT SYSTEM

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54101350A (en) * 1978-01-27 1979-08-09 Toshiba Corp Measuring method of centering and misalignment of hollow structures

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54101350A (en) * 1978-01-27 1979-08-09 Toshiba Corp Measuring method of centering and misalignment of hollow structures

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60256002A (en) * 1984-06-01 1985-12-17 Nippon Kogaku Kk <Nikon> Position detecting apparatus
JP2006337293A (en) * 2005-06-06 2006-12-14 Sekisui Chem Co Ltd Sighting device
JP4636944B2 (en) * 2005-06-06 2011-02-23 積水化学工業株式会社 Sighting device
FR3105049A1 (en) * 2019-12-19 2021-06-25 Sarl Metromecanica BORE ALIGNMENT CONTROL AND ADJUSTMENT SYSTEM

Also Published As

Publication number Publication date
JPS6248161B2 (en) 1987-10-13

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