JPS57205075U - - Google Patents

Info

Publication number
JPS57205075U
JPS57205075U JP9425581U JP9425581U JPS57205075U JP S57205075 U JPS57205075 U JP S57205075U JP 9425581 U JP9425581 U JP 9425581U JP 9425581 U JP9425581 U JP 9425581U JP S57205075 U JPS57205075 U JP S57205075U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9425581U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9425581U priority Critical patent/JPS57205075U/ja
Publication of JPS57205075U publication Critical patent/JPS57205075U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
JP9425581U 1981-06-25 1981-06-25 Pending JPS57205075U (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9425581U JPS57205075U (enrdf_load_stackoverflow) 1981-06-25 1981-06-25

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9425581U JPS57205075U (enrdf_load_stackoverflow) 1981-06-25 1981-06-25

Publications (1)

Publication Number Publication Date
JPS57205075U true JPS57205075U (enrdf_load_stackoverflow) 1982-12-27

Family

ID=29889189

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9425581U Pending JPS57205075U (enrdf_load_stackoverflow) 1981-06-25 1981-06-25

Country Status (1)

Country Link
JP (1) JPS57205075U (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6324171A (ja) * 1986-07-16 1988-02-01 Datsuku Kk 集積回路部品動作検査装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54156479A (en) * 1978-05-30 1979-12-10 Mitsubishi Electric Corp Test unit for integrated circuit device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54156479A (en) * 1978-05-30 1979-12-10 Mitsubishi Electric Corp Test unit for integrated circuit device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6324171A (ja) * 1986-07-16 1988-02-01 Datsuku Kk 集積回路部品動作検査装置

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