JPS57204509A - Scanning method and apparatus - Google Patents

Scanning method and apparatus

Info

Publication number
JPS57204509A
JPS57204509A JP8229582A JP8229582A JPS57204509A JP S57204509 A JPS57204509 A JP S57204509A JP 8229582 A JP8229582 A JP 8229582A JP 8229582 A JP8229582 A JP 8229582A JP S57204509 A JPS57204509 A JP S57204509A
Authority
JP
Japan
Prior art keywords
scanning method
scanning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8229582A
Other languages
Japanese (ja)
Inventor
Eru Iiton Hoomaa
Deii Shieiraa-Biringuzu Jiyon
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BEKUTORONIKUSU Inc
Original Assignee
BEKUTORONIKUSU Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BEKUTORONIKUSU Inc filed Critical BEKUTORONIKUSU Inc
Publication of JPS57204509A publication Critical patent/JPS57204509A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/954Inspecting the inner surface of hollow bodies, e.g. bores
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Mechanical Optical Scanning Systems (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
JP8229582A 1981-06-11 1982-05-13 Scanning method and apparatus Pending JPS57204509A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US27275781A 1981-06-11 1981-06-11

Publications (1)

Publication Number Publication Date
JPS57204509A true JPS57204509A (en) 1982-12-15

Family

ID=23041144

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8229582A Pending JPS57204509A (en) 1981-06-11 1982-05-13 Scanning method and apparatus

Country Status (3)

Country Link
JP (1) JPS57204509A (en)
DE (1) DE3220948A1 (en)
GB (1) GB2100424B (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62248288A (en) * 1986-04-21 1987-10-29 日本電気株式会社 Automatic aligner for circuit board
JPS646919A (en) * 1987-06-29 1989-01-11 Mc Science Kk Radiograph reader
JP2022532218A (en) * 2019-11-14 2022-07-13 上▲海▼精▲測▼半▲導▼体技▲術▼有限公司 Surface detector and method

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2549606B1 (en) * 1983-07-21 1985-10-18 Hispano Suiza Sa DEVICE FOR CONTROLLING THE MECHANICAL REMOVAL OF A LAYER OR DEPOSIT OF MATERIAL ON A SURFACE
FR2558257B1 (en) * 1984-01-13 1986-08-08 Agronomique Inst Nat Rech ELECTRONIC ENDOSCOPE
US4972090A (en) * 1989-08-03 1990-11-20 Eaton Homer L Method and apparatus for measuring and inspecting articles of manufacture for configuration
DE4202247A1 (en) * 1992-01-28 1993-07-29 Widmann Bildverarbeitungssyste DEVICE FOR OPTICALLY TESTING OBJECTS
FR2688063B1 (en) * 1992-02-28 1995-05-05 Framatome Sa DEVICE FOR CONTROLLING THE INTERNAL SURFACE OF A TUBE, PARTICULARLY OF A STEAM GENERATOR.
US11585905B2 (en) 2016-05-03 2023-02-21 Datalogic Ip Tech S.R.L. Laser scanner
DE102018121448B4 (en) * 2018-09-03 2022-06-02 SmartRay GmbH Inspection method and related device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4888944A (en) * 1972-02-01 1973-11-21

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA930214A (en) * 1969-10-27 1973-07-17 D. Wason Thomas Apparatus and method for optically inspecting the condition of a surface
JPS49121587A (en) * 1973-03-20 1974-11-20
NL7501009A (en) * 1975-01-29 1976-08-02 Skf Ind Trading & Dev DEVICE FOR AUTOMATIC DETECTION OF SURFACE ERRORS.

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4888944A (en) * 1972-02-01 1973-11-21

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62248288A (en) * 1986-04-21 1987-10-29 日本電気株式会社 Automatic aligner for circuit board
JPS646919A (en) * 1987-06-29 1989-01-11 Mc Science Kk Radiograph reader
JP2022532218A (en) * 2019-11-14 2022-07-13 上▲海▼精▲測▼半▲導▼体技▲術▼有限公司 Surface detector and method

Also Published As

Publication number Publication date
GB2100424B (en) 1985-08-21
DE3220948A1 (en) 1982-12-30
GB2100424A (en) 1982-12-22

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