JPS57199869U - - Google Patents
Info
- Publication number
- JPS57199869U JPS57199869U JP8677081U JP8677081U JPS57199869U JP S57199869 U JPS57199869 U JP S57199869U JP 8677081 U JP8677081 U JP 8677081U JP 8677081 U JP8677081 U JP 8677081U JP S57199869 U JPS57199869 U JP S57199869U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Relating To Insulation (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8677081U JPS57199869U (en) | 1981-06-15 | 1981-06-15 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8677081U JPS57199869U (en) | 1981-06-15 | 1981-06-15 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS57199869U true JPS57199869U (en) | 1982-12-18 |
Family
ID=29881983
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8677081U Pending JPS57199869U (en) | 1981-06-15 | 1981-06-15 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57199869U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5940866U (en) * | 1982-09-07 | 1984-03-15 | 京セラミタ株式会社 | Wiring connection failure detection device |
| JP2012516451A (en) * | 2009-01-27 | 2012-07-19 | クアルコム，インコーポレイテッド | Circuit for detecting tier-to-tier coupling in stacked integrated circuit devices |
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1981
- 1981-06-15 JP JP8677081U patent/JPS57199869U/ja active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5940866U (en) * | 1982-09-07 | 1984-03-15 | 京セラミタ株式会社 | Wiring connection failure detection device |
| JP2012516451A (en) * | 2009-01-27 | 2012-07-19 | クアルコム，インコーポレイテッド | Circuit for detecting tier-to-tier coupling in stacked integrated circuit devices |
| US8471582B2 (en) | 2009-01-27 | 2013-06-25 | Qualcomm Incorporated | Circuit for detecting tier-to-tier couplings in stacked integrated circuit devices |