JPS57199363A - Testing circuit of digital switchboard - Google Patents

Testing circuit of digital switchboard

Info

Publication number
JPS57199363A
JPS57199363A JP56084771A JP8477181A JPS57199363A JP S57199363 A JPS57199363 A JP S57199363A JP 56084771 A JP56084771 A JP 56084771A JP 8477181 A JP8477181 A JP 8477181A JP S57199363 A JPS57199363 A JP S57199363A
Authority
JP
Japan
Prior art keywords
memory
address
circuit
channel
monitoring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56084771A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0151226B2 (enrdf_load_stackoverflow
Inventor
Senji Soga
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP56084771A priority Critical patent/JPS57199363A/ja
Publication of JPS57199363A publication Critical patent/JPS57199363A/ja
Publication of JPH0151226B2 publication Critical patent/JPH0151226B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/24—Arrangements for supervision, monitoring or testing with provision for checking the normal operation
    • H04M3/244—Arrangements for supervision, monitoring or testing with provision for checking the normal operation for multiplex systems

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
  • Data Exchanges In Wide-Area Networks (AREA)
  • Use Of Switch Circuits For Exchanges And Methods Of Control Of Multiplex Exchanges (AREA)
JP56084771A 1981-06-02 1981-06-02 Testing circuit of digital switchboard Granted JPS57199363A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56084771A JPS57199363A (en) 1981-06-02 1981-06-02 Testing circuit of digital switchboard

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56084771A JPS57199363A (en) 1981-06-02 1981-06-02 Testing circuit of digital switchboard

Publications (2)

Publication Number Publication Date
JPS57199363A true JPS57199363A (en) 1982-12-07
JPH0151226B2 JPH0151226B2 (enrdf_load_stackoverflow) 1989-11-02

Family

ID=13839936

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56084771A Granted JPS57199363A (en) 1981-06-02 1981-06-02 Testing circuit of digital switchboard

Country Status (1)

Country Link
JP (1) JPS57199363A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7580300B2 (en) 2005-12-28 2009-08-25 Hynix Semiconductor Inc. Data output circuit of semiconductor memory apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7580300B2 (en) 2005-12-28 2009-08-25 Hynix Semiconductor Inc. Data output circuit of semiconductor memory apparatus
US7876628B2 (en) 2005-12-28 2011-01-25 Hynix Semiconductor Inc. Data output circuit

Also Published As

Publication number Publication date
JPH0151226B2 (enrdf_load_stackoverflow) 1989-11-02

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