JPS57186037U - - Google Patents

Info

Publication number
JPS57186037U
JPS57186037U JP7264281U JP7264281U JPS57186037U JP S57186037 U JPS57186037 U JP S57186037U JP 7264281 U JP7264281 U JP 7264281U JP 7264281 U JP7264281 U JP 7264281U JP S57186037 U JPS57186037 U JP S57186037U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7264281U
Other languages
Japanese (ja)
Other versions
JPS6218037Y2 (enrdf_load_html_response
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1981072642U priority Critical patent/JPS6218037Y2/ja
Publication of JPS57186037U publication Critical patent/JPS57186037U/ja
Application granted granted Critical
Publication of JPS6218037Y2 publication Critical patent/JPS6218037Y2/ja
Expired legal-status Critical Current

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Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1981072642U 1981-05-20 1981-05-20 Expired JPS6218037Y2 (enrdf_load_html_response)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1981072642U JPS6218037Y2 (enrdf_load_html_response) 1981-05-20 1981-05-20

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1981072642U JPS6218037Y2 (enrdf_load_html_response) 1981-05-20 1981-05-20

Publications (2)

Publication Number Publication Date
JPS57186037U true JPS57186037U (enrdf_load_html_response) 1982-11-26
JPS6218037Y2 JPS6218037Y2 (enrdf_load_html_response) 1987-05-09

Family

ID=29868420

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1981072642U Expired JPS6218037Y2 (enrdf_load_html_response) 1981-05-20 1981-05-20

Country Status (1)

Country Link
JP (1) JPS6218037Y2 (enrdf_load_html_response)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5098283A (enrdf_load_html_response) * 1973-12-26 1975-08-05
JPS54112174A (en) * 1978-02-22 1979-09-01 Nec Corp Testing method for semiconductor device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5098283A (enrdf_load_html_response) * 1973-12-26 1975-08-05
JPS54112174A (en) * 1978-02-22 1979-09-01 Nec Corp Testing method for semiconductor device

Also Published As

Publication number Publication date
JPS6218037Y2 (enrdf_load_html_response) 1987-05-09

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