JPS57179168U - - Google Patents
Info
- Publication number
- JPS57179168U JPS57179168U JP6584881U JP6584881U JPS57179168U JP S57179168 U JPS57179168 U JP S57179168U JP 6584881 U JP6584881 U JP 6584881U JP 6584881 U JP6584881 U JP 6584881U JP S57179168 U JPS57179168 U JP S57179168U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6584881U JPS6237172Y2 (https=) | 1981-05-07 | 1981-05-07 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6584881U JPS6237172Y2 (https=) | 1981-05-07 | 1981-05-07 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57179168U true JPS57179168U (https=) | 1982-11-13 |
| JPS6237172Y2 JPS6237172Y2 (https=) | 1987-09-22 |
Family
ID=29861875
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6584881U Expired JPS6237172Y2 (https=) | 1981-05-07 | 1981-05-07 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6237172Y2 (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62293629A (ja) * | 1986-06-12 | 1987-12-21 | Nec Corp | 半導体装置の加速寿命試験方法 |
-
1981
- 1981-05-07 JP JP6584881U patent/JPS6237172Y2/ja not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62293629A (ja) * | 1986-06-12 | 1987-12-21 | Nec Corp | 半導体装置の加速寿命試験方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6237172Y2 (https=) | 1987-09-22 |