JPS57178141A - Quantitative analysis method of al in sample consisting essentially of zno by plasma emission spectroscopic method - Google Patents

Quantitative analysis method of al in sample consisting essentially of zno by plasma emission spectroscopic method

Info

Publication number
JPS57178141A
JPS57178141A JP6322781A JP6322781A JPS57178141A JP S57178141 A JPS57178141 A JP S57178141A JP 6322781 A JP6322781 A JP 6322781A JP 6322781 A JP6322781 A JP 6322781A JP S57178141 A JPS57178141 A JP S57178141A
Authority
JP
Japan
Prior art keywords
sample
concn
acid
zno
constant
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6322781A
Other languages
Japanese (ja)
Inventor
Ikuo Hayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Meidensha Corp
Meidensha Electric Manufacturing Co Ltd
Original Assignee
Meidensha Corp
Meidensha Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Meidensha Corp, Meidensha Electric Manufacturing Co Ltd filed Critical Meidensha Corp
Priority to JP6322781A priority Critical patent/JPS57178141A/en
Publication of JPS57178141A publication Critical patent/JPS57178141A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/73—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To analyze the Al particularly in a voltage non-linear resistor quantitatively and quickly with high accuracy by fine grinding a sample consisting essentially of ZnO, dissolving the same in a pressurizing crucible by using HCl, making the concn. of acid and volume constant, and analyzing the Al in this soln. by a plasma emission spectroscopic method. CONSTITUTION:The Al in a sample such as a voltage non-linear resistor wherein ZnO occupies about 90wt% is dissolved in a pressurizing crucible by concd. HCl, and the concn. of acid is controlled constant (3 normal). A constant amt. of such soln. is sprayed in a plasma flame, and the resultant emission is spectroscopically analyzed, whereby the quantity of the Al is measured. Separately, a calibration curve is prepared beforehand by treating the sample of a known content of Al in the similar manner and controlling the concn. of acid similarly (3 normal), and from the measured value of the emission intensity of the actual sample, the content is known. There is a tendency toward a decrease in the measured value of emission intensity when the concn. of acid increases and therefore the concn. of acid is maintained constant during measurement. The influence of the elements coexisting in the sample is eliminated by adding Zn of the same amt. as that of the sample to be analyzed in the sample for the calibration curve as well. In this way, the Al is measured quickly with good accuracy and is used for controlling the quality and processes of the above-described resistor.
JP6322781A 1981-04-28 1981-04-28 Quantitative analysis method of al in sample consisting essentially of zno by plasma emission spectroscopic method Pending JPS57178141A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6322781A JPS57178141A (en) 1981-04-28 1981-04-28 Quantitative analysis method of al in sample consisting essentially of zno by plasma emission spectroscopic method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6322781A JPS57178141A (en) 1981-04-28 1981-04-28 Quantitative analysis method of al in sample consisting essentially of zno by plasma emission spectroscopic method

Publications (1)

Publication Number Publication Date
JPS57178141A true JPS57178141A (en) 1982-11-02

Family

ID=13223105

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6322781A Pending JPS57178141A (en) 1981-04-28 1981-04-28 Quantitative analysis method of al in sample consisting essentially of zno by plasma emission spectroscopic method

Country Status (1)

Country Link
JP (1) JPS57178141A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104048951A (en) * 2014-07-04 2014-09-17 武钢集团昆明钢铁股份有限公司 Method for measuring contents of silicon, calcium and aluminum in additives and co-solvents of permanent magnetic ferrites through ICP (Inductively Coupled Plasma) emission spectroscopy
CN104374790A (en) * 2014-11-25 2015-02-25 上海交通大学 XRF (X-ray fluorescence spectrometry) method for rapidly detecting aluminum content in fried foods

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104048951A (en) * 2014-07-04 2014-09-17 武钢集团昆明钢铁股份有限公司 Method for measuring contents of silicon, calcium and aluminum in additives and co-solvents of permanent magnetic ferrites through ICP (Inductively Coupled Plasma) emission spectroscopy
CN104374790A (en) * 2014-11-25 2015-02-25 上海交通大学 XRF (X-ray fluorescence spectrometry) method for rapidly detecting aluminum content in fried foods

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