JPS57149932A - Force detection system - Google Patents

Force detection system

Info

Publication number
JPS57149932A
JPS57149932A JP3599681A JP3599681A JPS57149932A JP S57149932 A JPS57149932 A JP S57149932A JP 3599681 A JP3599681 A JP 3599681A JP 3599681 A JP3599681 A JP 3599681A JP S57149932 A JPS57149932 A JP S57149932A
Authority
JP
Japan
Prior art keywords
force detection
load
gauges
axial
tension
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3599681A
Other languages
Japanese (ja)
Inventor
Kazuo Yamaha
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP3599681A priority Critical patent/JPS57149932A/en
Publication of JPS57149932A publication Critical patent/JPS57149932A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Force In General (AREA)

Abstract

PURPOSE:To achieve invariably precise force detection by forming a bridge circuit by sticking strain gauges on tension sides and compression sides at a fixed position in the axial direction of a beam member for detecting a load on the beam member. CONSTITUTION:A load W operates on a cantilever member 11. Strain gauges A and B are stuck to the tension and compression sides of the cantilever member 11 at distance l1 from an axial fixed position, and strain gauges C and D are also stuck to the tension side and compression side at distance l2 from the axial fixed position. Those gauges A-D constitute a bridgecircuit, and axial intervals L between the gauges A and B, and C and D are (l1-l2); even if the free end shifts in position, and if the working point of the load W varies, the intervals remain constant, thus achieving precise force detection.
JP3599681A 1981-03-13 1981-03-13 Force detection system Pending JPS57149932A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3599681A JPS57149932A (en) 1981-03-13 1981-03-13 Force detection system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3599681A JPS57149932A (en) 1981-03-13 1981-03-13 Force detection system

Publications (1)

Publication Number Publication Date
JPS57149932A true JPS57149932A (en) 1982-09-16

Family

ID=12457419

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3599681A Pending JPS57149932A (en) 1981-03-13 1981-03-13 Force detection system

Country Status (1)

Country Link
JP (1) JPS57149932A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5608172A (en) * 1995-03-16 1997-03-04 Texas Instruments Incorporated Die bond touch down detector
JP2001324423A (en) * 2000-05-16 2001-11-22 Chuo Seiki Kk Stress-measuring device for microtome, sample- determining device in microtome, and stress-calibrating method in microtome
CN1316235C (en) * 2005-01-27 2007-05-16 上海交通大学 Two-dimensional micro-force measuring sensors

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4851660A (en) * 1971-10-29 1973-07-20

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4851660A (en) * 1971-10-29 1973-07-20

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5608172A (en) * 1995-03-16 1997-03-04 Texas Instruments Incorporated Die bond touch down detector
JP2001324423A (en) * 2000-05-16 2001-11-22 Chuo Seiki Kk Stress-measuring device for microtome, sample- determining device in microtome, and stress-calibrating method in microtome
JP4530477B2 (en) * 2000-05-16 2010-08-25 株式会社池上精機 Stress measuring device for microtome
CN1316235C (en) * 2005-01-27 2007-05-16 上海交通大学 Two-dimensional micro-force measuring sensors

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