JPS57148268A - Logical circuit inspecting device - Google Patents
Logical circuit inspecting deviceInfo
- Publication number
- JPS57148268A JPS57148268A JP56033914A JP3391481A JPS57148268A JP S57148268 A JPS57148268 A JP S57148268A JP 56033914 A JP56033914 A JP 56033914A JP 3391481 A JP3391481 A JP 3391481A JP S57148268 A JPS57148268 A JP S57148268A
- Authority
- JP
- Japan
- Prior art keywords
- lsi
- package
- jig
- hole
- commercially available
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE:To make it possible to automatically work out diagnosis data by a computer or the like, through permitting a development of a logical circuit portion except commercially available LSI on a package on gate level by arranging the package in such a form as excluding commercially available LSI. CONSTITUTION:In the case of detecting a package, an LSI-replacing jig 13 is put into an LSI 5, a testing through hole 9 and an LSI-separating through hole 8. In case if plural pieces of LSI which are unable to make gate development are mounted on a package, jigs 13 are inserted into all of these LSI. An LSI- separating lead pin 14 is connected to GND in the jig 13. When the jig 13 is pressed in, the through hole 8 changes from high level to low level in the case of TTL, and outputs of an additional gates 10 are raised to high level equally. By doing so, output of the LSI 5 is cut, and input of the LSI 5 passes through other circuit and wiring, which are easily able to diagnose logic, than the commercially available LSI 5 in the jig 13, that is, the input goes through an LSI-replacing circuit module G and reaches the through hole 9.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56033914A JPS57148268A (en) | 1981-03-11 | 1981-03-11 | Logical circuit inspecting device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56033914A JPS57148268A (en) | 1981-03-11 | 1981-03-11 | Logical circuit inspecting device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57148268A true JPS57148268A (en) | 1982-09-13 |
Family
ID=12399780
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56033914A Pending JPS57148268A (en) | 1981-03-11 | 1981-03-11 | Logical circuit inspecting device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57148268A (en) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5643858U (en) * | 1979-09-10 | 1981-04-21 |
-
1981
- 1981-03-11 JP JP56033914A patent/JPS57148268A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5643858U (en) * | 1979-09-10 | 1981-04-21 |
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