JPS5714743A - System for infrared spectrochemical analysis - Google Patents

System for infrared spectrochemical analysis

Info

Publication number
JPS5714743A
JPS5714743A JP8959180A JP8959180A JPS5714743A JP S5714743 A JPS5714743 A JP S5714743A JP 8959180 A JP8959180 A JP 8959180A JP 8959180 A JP8959180 A JP 8959180A JP S5714743 A JPS5714743 A JP S5714743A
Authority
JP
Japan
Prior art keywords
infrared
signal
signals
laser beam
laser
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8959180A
Other languages
Japanese (ja)
Other versions
JPS6218010B2 (en
Inventor
Hirobumi Kashiwara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP8959180A priority Critical patent/JPS5714743A/en
Publication of JPS5714743A publication Critical patent/JPS5714743A/en
Publication of JPS6218010B2 publication Critical patent/JPS6218010B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers

Abstract

PURPOSE:To perform an infrared spectrochemical analysis suppressed a laser noise, by branching semiconductor laser beam, then subjecting one laser beam to a photoelectric conversion after passing through an object of analysis, and on the other hand subjecting the other laser beam directly to photoelectric conversion, thus by taking out the difference of both signals. CONSTITUTION:Luminescence of a semiconductor laser 1 emitting infrared rays is chopped by a chopper 2 and is divided into two by a light branching means 3 using a semitransparent mirror or the like. One branched beam (a) is passed through a gas cell 4 and is made incident to the first infrared-ray-detector 5 to convert into an electric signal. The other branched beam (b) is passed through a variable attenuator 7 and is made incident to the second infrared-ray-detector 6 to convert into the electric signal. Signals of this two systems are applied to a differential amplifier 8 and the signal proportional to the difference of both signals is taken out as an output. The signal outputted to an output terminal 9 is a video signal ejected a laser noise and is applied to a display device through a signal processing circuit 10 and is displayed as the image of infrared rays.
JP8959180A 1980-06-30 1980-06-30 System for infrared spectrochemical analysis Granted JPS5714743A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8959180A JPS5714743A (en) 1980-06-30 1980-06-30 System for infrared spectrochemical analysis

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8959180A JPS5714743A (en) 1980-06-30 1980-06-30 System for infrared spectrochemical analysis

Publications (2)

Publication Number Publication Date
JPS5714743A true JPS5714743A (en) 1982-01-26
JPS6218010B2 JPS6218010B2 (en) 1987-04-21

Family

ID=13975016

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8959180A Granted JPS5714743A (en) 1980-06-30 1980-06-30 System for infrared spectrochemical analysis

Country Status (1)

Country Link
JP (1) JPS5714743A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6057237A (en) * 1983-09-09 1985-04-03 Konishiroku Photo Ind Co Ltd Method for measuring reflection density in biochemical analysis
JPS61174689A (en) * 1985-01-29 1986-08-06 Rohm Co Ltd Setting method of die-bonding position of semiconductor chip for electronic component
JP2005043069A (en) * 2003-07-22 2005-02-17 Dainippon Screen Mfg Co Ltd Absorbance meter, concentration measuring instrument, plating liquid analyzer, plating device, plating liquid analytical method, and plating method
JP2010145320A (en) * 2008-12-22 2010-07-01 General Packer Co Ltd Gas measuring instrument

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6411117U (en) * 1987-07-08 1989-01-20

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5250275A (en) * 1975-10-20 1977-04-22 Sanyo Electric Co Ltd Apparatus for measuring quantity of light using laser

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5250275A (en) * 1975-10-20 1977-04-22 Sanyo Electric Co Ltd Apparatus for measuring quantity of light using laser

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6057237A (en) * 1983-09-09 1985-04-03 Konishiroku Photo Ind Co Ltd Method for measuring reflection density in biochemical analysis
JPS61174689A (en) * 1985-01-29 1986-08-06 Rohm Co Ltd Setting method of die-bonding position of semiconductor chip for electronic component
JP2005043069A (en) * 2003-07-22 2005-02-17 Dainippon Screen Mfg Co Ltd Absorbance meter, concentration measuring instrument, plating liquid analyzer, plating device, plating liquid analytical method, and plating method
JP2010145320A (en) * 2008-12-22 2010-07-01 General Packer Co Ltd Gas measuring instrument

Also Published As

Publication number Publication date
JPS6218010B2 (en) 1987-04-21

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