JPS57140169U - - Google Patents

Info

Publication number
JPS57140169U
JPS57140169U JP2727481U JP2727481U JPS57140169U JP S57140169 U JPS57140169 U JP S57140169U JP 2727481 U JP2727481 U JP 2727481U JP 2727481 U JP2727481 U JP 2727481U JP S57140169 U JPS57140169 U JP S57140169U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2727481U
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2727481U priority Critical patent/JPS57140169U/ja
Publication of JPS57140169U publication Critical patent/JPS57140169U/ja
Pending legal-status Critical Current

Links

JP2727481U 1981-02-27 1981-02-27 Pending JPS57140169U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2727481U JPS57140169U (ja) 1981-02-27 1981-02-27

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2727481U JPS57140169U (ja) 1981-02-27 1981-02-27

Publications (1)

Publication Number Publication Date
JPS57140169U true JPS57140169U (ja) 1982-09-02

Family

ID=29824995

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2727481U Pending JPS57140169U (ja) 1981-02-27 1981-02-27

Country Status (1)

Country Link
JP (1) JPS57140169U (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02278641A (ja) * 1989-04-20 1990-11-14 Hitachi Ltd 電子レンズの冷却系
EP3200216A1 (en) * 2016-01-26 2017-08-02 Advantest Corporation Charged particle beam lens apparatus, charged particle beam column, and charged particle beam exposure apparatus
WO2020108984A3 (en) * 2018-11-30 2020-07-30 Asml Netherlands B.V. Systems and methods of cooling objective lens of a charged-particle beam system

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5336169A (en) * 1976-09-16 1978-04-04 Hitachi Ltd Electron lens

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5336169A (en) * 1976-09-16 1978-04-04 Hitachi Ltd Electron lens

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02278641A (ja) * 1989-04-20 1990-11-14 Hitachi Ltd 電子レンズの冷却系
EP3200216A1 (en) * 2016-01-26 2017-08-02 Advantest Corporation Charged particle beam lens apparatus, charged particle beam column, and charged particle beam exposure apparatus
CN107017142A (zh) * 2016-01-26 2017-08-04 爱德万测试株式会社 带电粒子束透镜装置、带电粒子束柱及带电粒子束曝光装置
WO2020108984A3 (en) * 2018-11-30 2020-07-30 Asml Netherlands B.V. Systems and methods of cooling objective lens of a charged-particle beam system

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