JPS57130255U - - Google Patents
Info
- Publication number
- JPS57130255U JPS57130255U JP1981016581U JP1658181U JPS57130255U JP S57130255 U JPS57130255 U JP S57130255U JP 1981016581 U JP1981016581 U JP 1981016581U JP 1658181 U JP1658181 U JP 1658181U JP S57130255 U JPS57130255 U JP S57130255U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/065—Integrating spheres
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1981016581U JPS57130255U (en) | 1981-02-06 | 1981-02-06 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1981016581U JPS57130255U (en) | 1981-02-06 | 1981-02-06 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS57130255U true JPS57130255U (en) | 1982-08-13 |
Family
ID=29814562
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1981016581U Pending JPS57130255U (en) | 1981-02-06 | 1981-02-06 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57130255U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009531659A (en) * | 2006-03-23 | 2009-09-03 | ハック・カンパニー | Dual function measurement system |
-
1981
- 1981-02-06 JP JP1981016581U patent/JPS57130255U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009531659A (en) * | 2006-03-23 | 2009-09-03 | ハック・カンパニー | Dual function measurement system |