JPS5711264Y2 - - Google Patents
Info
- Publication number
- JPS5711264Y2 JPS5711264Y2 JP11501477U JP11501477U JPS5711264Y2 JP S5711264 Y2 JPS5711264 Y2 JP S5711264Y2 JP 11501477 U JP11501477 U JP 11501477U JP 11501477 U JP11501477 U JP 11501477U JP S5711264 Y2 JPS5711264 Y2 JP S5711264Y2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11501477U JPS5711264Y2 (en) | 1977-08-26 | 1977-08-26 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11501477U JPS5711264Y2 (en) | 1977-08-26 | 1977-08-26 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5441171U JPS5441171U (en) | 1979-03-19 |
| JPS5711264Y2 true JPS5711264Y2 (en) | 1982-03-05 |
Family
ID=29066274
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11501477U Expired JPS5711264Y2 (en) | 1977-08-26 | 1977-08-26 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5711264Y2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2577525Y2 (en) * | 1989-12-23 | 1998-07-30 | 株式会社 住友金属セラミックス | Short / open inspection equipment |
-
1977
- 1977-08-26 JP JP11501477U patent/JPS5711264Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5441171U (en) | 1979-03-19 |