JPS57110909A - Thickness gauge for gamma rays - Google Patents

Thickness gauge for gamma rays

Info

Publication number
JPS57110909A
JPS57110909A JP56181179A JP18117981A JPS57110909A JP S57110909 A JPS57110909 A JP S57110909A JP 56181179 A JP56181179 A JP 56181179A JP 18117981 A JP18117981 A JP 18117981A JP S57110909 A JPS57110909 A JP S57110909A
Authority
JP
Japan
Prior art keywords
counting
crest
crest value
secondary electron
gamma rays
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56181179A
Other languages
Japanese (ja)
Inventor
Tetsuo Washimi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP56181179A priority Critical patent/JPS57110909A/en
Publication of JPS57110909A publication Critical patent/JPS57110909A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To obtain a thickness gauge for steel sheet which prevents from the occurrence of an error and utilizes the absorption of gamma rays, by a method wherein a property of a scintillator and a secondary electron multiplying tube is compensated by automatically restoring a wave-crest value of a relation between a crest value and a counting factor. CONSTITUTION:A gamma ray source is placed at one side of an object to be measured, and after gamma rays pass through the object to be measured, a scintillator 4 is caused to emit light, and the light is converted into an electric pulse by a secondary electron multiplying tube 5. A crest value.counting factor of a pulse is indicated as shown in a drawing, and a correspondence relation, which is set such that, as the thickness of the object to be measured increases, the counting factor decreases, is utilized as a thickness gauge. The wave-crest value end part moves due to a change in property of a device, and in order to prevent the occurrence of a resultant counting error, appropriate crest values X and Y are set to control a high-voltage source 17 to the secondary electron multiplying tube so that a ratio between the counting factors x and y is restored to a normality by a crest discriminator 14, a digital detector 15, and a comparison circuit 16.
JP56181179A 1981-11-13 1981-11-13 Thickness gauge for gamma rays Pending JPS57110909A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56181179A JPS57110909A (en) 1981-11-13 1981-11-13 Thickness gauge for gamma rays

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56181179A JPS57110909A (en) 1981-11-13 1981-11-13 Thickness gauge for gamma rays

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP51113671A Division JPS5831842B2 (en) 1976-09-24 1976-09-24 gamma ray thickness meter

Publications (1)

Publication Number Publication Date
JPS57110909A true JPS57110909A (en) 1982-07-10

Family

ID=16096251

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56181179A Pending JPS57110909A (en) 1981-11-13 1981-11-13 Thickness gauge for gamma rays

Country Status (1)

Country Link
JP (1) JPS57110909A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59155708A (en) * 1983-02-25 1984-09-04 Sumitomo Metal Ind Ltd Measurement of plate thickness for automatic plate thickness control equipment
JP2009272439A (en) * 2008-05-07 2009-11-19 Funai Electric Co Ltd Inverter transformer

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59155708A (en) * 1983-02-25 1984-09-04 Sumitomo Metal Ind Ltd Measurement of plate thickness for automatic plate thickness control equipment
JP2009272439A (en) * 2008-05-07 2009-11-19 Funai Electric Co Ltd Inverter transformer

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