JPS57106848A - External appearance test of semiconductor pellet - Google Patents
External appearance test of semiconductor pelletInfo
- Publication number
- JPS57106848A JPS57106848A JP18323480A JP18323480A JPS57106848A JP S57106848 A JPS57106848 A JP S57106848A JP 18323480 A JP18323480 A JP 18323480A JP 18323480 A JP18323480 A JP 18323480A JP S57106848 A JPS57106848 A JP S57106848A
- Authority
- JP
- Japan
- Prior art keywords
- needle
- defect
- sheet
- pellets
- lighting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8803—Visual inspection
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
PURPOSE:To simplify the check of positions and to remove pelllets precisely when defects pelleto are pushed off with a needle from semiconductor pellets attached to a sheet by spot lighting the places of defect pellets. CONSTITUTION:Plural semiconductor pellets arranged in line and attached to the back of a transparent or semitransparent sheet 2 are held on a top part of an inner cylinder 7 by putting the sheet 2 between the inner cylinder 7 and outter cylinder 6. A spot light source 10 set up so as to be united with a needle 9 to push off defect pellets from the sheet irradiates near the top of the needle 9. When the needle 9 is brought close to the sheet 2 and the spot light source 10 lightens pellets, the lighting image of a lighting spot is observed through mirrors 4, 5 and the position of the needle 9 is confirmed on the instant. Thus, if the lighting image is observed on the surface image of a defect pellet before the needle 9 pushes off the defect pellet, the defect pellet can be removed precisely.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18323480A JPS57106848A (en) | 1980-12-23 | 1980-12-23 | External appearance test of semiconductor pellet |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18323480A JPS57106848A (en) | 1980-12-23 | 1980-12-23 | External appearance test of semiconductor pellet |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57106848A true JPS57106848A (en) | 1982-07-02 |
Family
ID=16132118
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP18323480A Pending JPS57106848A (en) | 1980-12-23 | 1980-12-23 | External appearance test of semiconductor pellet |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57106848A (en) |
-
1980
- 1980-12-23 JP JP18323480A patent/JPS57106848A/en active Pending
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