JPS5710465A - Pulse width measurement circuit - Google Patents
Pulse width measurement circuitInfo
- Publication number
- JPS5710465A JPS5710465A JP8545480A JP8545480A JPS5710465A JP S5710465 A JPS5710465 A JP S5710465A JP 8545480 A JP8545480 A JP 8545480A JP 8545480 A JP8545480 A JP 8545480A JP S5710465 A JPS5710465 A JP S5710465A
- Authority
- JP
- Japan
- Prior art keywords
- pulse
- measured
- pulse width
- delay lines
- output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
- G01R29/027—Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values
- G01R29/0273—Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values the pulse characteristic being duration, i.e. width (indicating that frequency of pulses is above or below a certain limit)
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manipulation Of Pulses (AREA)
Abstract
PURPOSE:To measure simply short pulse width by memorizing whether the pulse to be measured is appeared or not in the leading end of the output of plurality of delay lines whereon the pulse to be measured is to be impressed. CONSTITUTION:Before the start of measurement the contents of memory of flip- flop F0-F4 are cleared by the clear pulse CLA. The pulse A to be measured is delayed by X by means of the first delay line D1 and be further delayed respectively by Y by means of the delay lines D2-D5. And in the leading end of the output pulse T0-T4 from the delay lines D1-D5 the flip-flop F0-F4 memorize whether or not the pulse A to be mesured is appeared to light the luminous diode connected with the output terminals Q0-Q4. Thereby the pulse width of the pulse to be measured can be simply measured without using a counter.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8545480A JPS5710465A (en) | 1980-06-24 | 1980-06-24 | Pulse width measurement circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8545480A JPS5710465A (en) | 1980-06-24 | 1980-06-24 | Pulse width measurement circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5710465A true JPS5710465A (en) | 1982-01-20 |
Family
ID=13859322
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8545480A Pending JPS5710465A (en) | 1980-06-24 | 1980-06-24 | Pulse width measurement circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5710465A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59179386U (en) * | 1983-05-18 | 1984-11-30 | 株式会社アドバンテスト | Pulse width inspection device |
EP1043596A2 (en) * | 1999-03-30 | 2000-10-11 | Infineon Technologies North America Corp. | Pulse width detection |
GB2412828A (en) * | 2004-03-31 | 2005-10-05 | Agilent Technologies Inc | Measuring bit width by latching signal values from a tapped delay line into a sticky register upon detecting an edge |
CN102981063A (en) * | 2012-11-13 | 2013-03-20 | 工业和信息化部电子第五研究所 | Single-particle transient state pulse width measurement method and measurement device and pulse generation device |
-
1980
- 1980-06-24 JP JP8545480A patent/JPS5710465A/en active Pending
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59179386U (en) * | 1983-05-18 | 1984-11-30 | 株式会社アドバンテスト | Pulse width inspection device |
EP1043596A2 (en) * | 1999-03-30 | 2000-10-11 | Infineon Technologies North America Corp. | Pulse width detection |
EP1043596A3 (en) * | 1999-03-30 | 2003-07-09 | Infineon Technologies North America Corp. | Pulse width detection |
KR100685081B1 (en) * | 1999-03-30 | 2007-02-22 | 인피니언 테크놀로지스 노쓰 아메리카 코포레이션 | Pulse width detection |
GB2412828A (en) * | 2004-03-31 | 2005-10-05 | Agilent Technologies Inc | Measuring bit width by latching signal values from a tapped delay line into a sticky register upon detecting an edge |
GB2412828B (en) * | 2004-03-31 | 2006-11-08 | Agilent Technologies Inc | Unit interval discovery for a bus receiver |
US7372931B2 (en) | 2004-03-31 | 2008-05-13 | Agilent Technologies, Inc. | Unit interval discovery for a bus receiver |
CN102981063A (en) * | 2012-11-13 | 2013-03-20 | 工业和信息化部电子第五研究所 | Single-particle transient state pulse width measurement method and measurement device and pulse generation device |
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