JPS5679848U - - Google Patents
Info
- Publication number
- JPS5679848U JPS5679848U JP16314379U JP16314379U JPS5679848U JP S5679848 U JPS5679848 U JP S5679848U JP 16314379 U JP16314379 U JP 16314379U JP 16314379 U JP16314379 U JP 16314379U JP S5679848 U JPS5679848 U JP S5679848U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16314379U JPS5679848U (it) | 1979-11-27 | 1979-11-27 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16314379U JPS5679848U (it) | 1979-11-27 | 1979-11-27 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5679848U true JPS5679848U (it) | 1981-06-29 |
Family
ID=29674144
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16314379U Pending JPS5679848U (it) | 1979-11-27 | 1979-11-27 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5679848U (it) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS52125389A (en) * | 1976-04-13 | 1977-10-21 | Omron Tateisi Electronics Co | Defect inspection apparatus |
-
1979
- 1979-11-27 JP JP16314379U patent/JPS5679848U/ja active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS52125389A (en) * | 1976-04-13 | 1977-10-21 | Omron Tateisi Electronics Co | Defect inspection apparatus |