JPS5673305A - Method and device for measuring depth of surface layer of metal workpiece - Google Patents

Method and device for measuring depth of surface layer of metal workpiece

Info

Publication number
JPS5673305A
JPS5673305A JP15297380A JP15297380A JPS5673305A JP S5673305 A JPS5673305 A JP S5673305A JP 15297380 A JP15297380 A JP 15297380A JP 15297380 A JP15297380 A JP 15297380A JP S5673305 A JPS5673305 A JP S5673305A
Authority
JP
Japan
Prior art keywords
surface layer
metal workpiece
measuring depth
depth
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15297380A
Other languages
English (en)
Japanese (ja)
Inventor
Omini Maruko
Rasutarudo Arudo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centro Ricerche Fiat SCpA
Original Assignee
Centro Ricerche Fiat SCpA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centro Ricerche Fiat SCpA filed Critical Centro Ricerche Fiat SCpA
Publication of JPS5673305A publication Critical patent/JPS5673305A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
JP15297380A 1979-10-31 1980-10-30 Method and device for measuring depth of surface layer of metal workpiece Pending JPS5673305A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT69132/79A IT1119559B (it) 1979-10-31 1979-10-31 Procedimento e dispositivo per la misura della profondita di uno strato superficiale di un pezzo metallico avente caratteristiche fisiche differenti da quelle della parte rimamente

Publications (1)

Publication Number Publication Date
JPS5673305A true JPS5673305A (en) 1981-06-18

Family

ID=11311415

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15297380A Pending JPS5673305A (en) 1979-10-31 1980-10-30 Method and device for measuring depth of surface layer of metal workpiece

Country Status (5)

Country Link
JP (1) JPS5673305A (member.php)
DE (1) DE3040926A1 (member.php)
FR (1) FR2468876A1 (member.php)
GB (1) GB2062241B (member.php)
IT (1) IT1119559B (member.php)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6466501A (en) * 1987-09-08 1989-03-13 Sumitomo Spec Metals Thickness measurement of insb single crystal wafer for compound substrate

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2274712B (en) * 1993-01-22 1997-01-15 Brecknell Willis & Co Ltd Non-destructive testing of composite conductor rails
US7443177B1 (en) * 2005-05-31 2008-10-28 Iowa State University Research Foundation, Inc. Characterization of conductor by alternating current potential-drop method with a four-point probe

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1895643A (en) * 1929-03-05 1933-01-31 Standard Oil Co California Method of and apparatus for measuring the thickness of metal
US2854626A (en) * 1954-12-31 1958-09-30 Davidson Martin Plating thickness indicator
US3365663A (en) * 1962-06-29 1968-01-23 Shin Mitsubishi Jukogyo Kk Thickness measuring instrument for electro-conductive objects and associated methods
SE320676B (member.php) * 1968-03-14 1970-02-16 Aka Ab Apparatkemiska

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6466501A (en) * 1987-09-08 1989-03-13 Sumitomo Spec Metals Thickness measurement of insb single crystal wafer for compound substrate

Also Published As

Publication number Publication date
FR2468876B3 (member.php) 1983-04-08
FR2468876A1 (fr) 1981-05-08
IT1119559B (it) 1986-03-10
GB2062241B (en) 1983-12-07
DE3040926A1 (de) 1981-09-03
GB2062241A (en) 1981-05-20
IT7969132A0 (it) 1979-10-31

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