JPS5662565U - - Google Patents
Info
- Publication number
- JPS5662565U JPS5662565U JP14618179U JP14618179U JPS5662565U JP S5662565 U JPS5662565 U JP S5662565U JP 14618179 U JP14618179 U JP 14618179U JP 14618179 U JP14618179 U JP 14618179U JP S5662565 U JPS5662565 U JP S5662565U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14618179U JPS5662565U (en) | 1979-10-22 | 1979-10-22 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14618179U JPS5662565U (en) | 1979-10-22 | 1979-10-22 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5662565U true JPS5662565U (en) | 1981-05-27 |
Family
ID=29377344
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14618179U Pending JPS5662565U (en) | 1979-10-22 | 1979-10-22 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5662565U (en) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS50104082A (en) * | 1974-01-18 | 1975-08-16 | ||
JPS5123782A (en) * | 1974-05-28 | 1976-02-25 | Ferranti Ltd | Ketsukankenshutsukyonokairokosei |
JPS5327477A (en) * | 1976-08-26 | 1978-03-14 | Agency Of Ind Science & Technol | Defect detection of material su rface |
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1979
- 1979-10-22 JP JP14618179U patent/JPS5662565U/ja active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS50104082A (en) * | 1974-01-18 | 1975-08-16 | ||
JPS5123782A (en) * | 1974-05-28 | 1976-02-25 | Ferranti Ltd | Ketsukankenshutsukyonokairokosei |
JPS5327477A (en) * | 1976-08-26 | 1978-03-14 | Agency Of Ind Science & Technol | Defect detection of material su rface |