JPS5653681B2 - - Google Patents
Info
- Publication number
- JPS5653681B2 JPS5653681B2 JP1879876A JP1879876A JPS5653681B2 JP S5653681 B2 JPS5653681 B2 JP S5653681B2 JP 1879876 A JP1879876 A JP 1879876A JP 1879876 A JP1879876 A JP 1879876A JP S5653681 B2 JPS5653681 B2 JP S5653681B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1879876A JPS52102783A (en) | 1976-02-25 | 1976-02-25 | Method of measuring maximum diameter of bruise in brinell hardness test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1879876A JPS52102783A (en) | 1976-02-25 | 1976-02-25 | Method of measuring maximum diameter of bruise in brinell hardness test |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS52102783A JPS52102783A (en) | 1977-08-29 |
| JPS5653681B2 true JPS5653681B2 (es) | 1981-12-21 |
Family
ID=11981600
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1879876A Granted JPS52102783A (en) | 1976-02-25 | 1976-02-25 | Method of measuring maximum diameter of bruise in brinell hardness test |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS52102783A (es) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4653106A (en) * | 1982-09-25 | 1987-03-24 | Matsuzawa Seiki Kabushikikaisha | Indentation hardness meter |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5015156A (es) * | 1973-06-12 | 1975-02-18 | ||
| JPS5015154A (es) * | 1973-06-13 | 1975-02-18 | ||
| JPS5034945A (es) * | 1973-07-30 | 1975-04-03 | ||
| JPS5322456A (en) * | 1976-06-21 | 1978-03-01 | Leybold Heraeus Verwaltung | Apparatus for measuring and controlling thickness of thin layer generating optical effect |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS534118Y2 (es) * | 1972-12-29 | 1978-02-01 |
-
1976
- 1976-02-25 JP JP1879876A patent/JPS52102783A/ja active Granted
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5015156A (es) * | 1973-06-12 | 1975-02-18 | ||
| JPS5015154A (es) * | 1973-06-13 | 1975-02-18 | ||
| JPS5034945A (es) * | 1973-07-30 | 1975-04-03 | ||
| JPS5322456A (en) * | 1976-06-21 | 1978-03-01 | Leybold Heraeus Verwaltung | Apparatus for measuring and controlling thickness of thin layer generating optical effect |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS52102783A (en) | 1977-08-29 |