JPS5651630A - Method of and apparatus for compensating photoelectric tranducer for dark current - Google Patents

Method of and apparatus for compensating photoelectric tranducer for dark current

Info

Publication number
JPS5651630A
JPS5651630A JP13222980A JP13222980A JPS5651630A JP S5651630 A JPS5651630 A JP S5651630A JP 13222980 A JP13222980 A JP 13222980A JP 13222980 A JP13222980 A JP 13222980A JP S5651630 A JPS5651630 A JP S5651630A
Authority
JP
Japan
Prior art keywords
tranducer
dark current
photoelectric
compensating
compensating photoelectric
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13222980A
Other languages
English (en)
Inventor
Furanku Batsukusu Ronarudo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Pfizer Inc
Original Assignee
Pfizer Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pfizer Inc filed Critical Pfizer Inc
Publication of JPS5651630A publication Critical patent/JPS5651630A/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/20Measuring radiation intensity with scintillation detectors
    • G01T1/208Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44Electric circuits

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Molecular Biology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Amplifiers (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Light Receiving Elements (AREA)
  • Measurement Of Current Or Voltage (AREA)
JP13222980A 1979-09-24 1980-09-22 Method of and apparatus for compensating photoelectric tranducer for dark current Pending JPS5651630A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US7839679A 1979-09-24 1979-09-24

Publications (1)

Publication Number Publication Date
JPS5651630A true JPS5651630A (en) 1981-05-09

Family

ID=22143781

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13222980A Pending JPS5651630A (en) 1979-09-24 1980-09-22 Method of and apparatus for compensating photoelectric tranducer for dark current

Country Status (7)

Country Link
EP (1) EP0026108A3 (ja)
JP (1) JPS5651630A (ja)
BR (1) BR8006060A (ja)
DK (1) DK401680A (ja)
ES (1) ES8200478A1 (ja)
GR (1) GR70063B (ja)
MX (1) MX148233A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008523872A (ja) * 2004-12-17 2008-07-10 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 連続的な検出器補正に対するパルスx線

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8630136D0 (en) * 1986-12-17 1987-01-28 Grand Metropolitan Innovation Luminometer apparatus
US4880981A (en) * 1988-03-11 1989-11-14 Bicron Corporation Low level radiation measurement device
JP2954404B2 (ja) * 1991-10-09 1999-09-27 株式会社日本コンラックス 光学的情報記録再生装置
JP3740315B2 (ja) * 1999-03-12 2006-02-01 株式会社日立製作所 X線センサ信号処理回路及びそれを用いたx線ct装置並びにx線センサ信号処理方法
US6859511B2 (en) 1999-03-12 2005-02-22 Hitachi, Ltd. X-ray sensor signal processor and x-ray computed tomography system using the same
CN110542830A (zh) * 2019-08-15 2019-12-06 杭州柯林电气股份有限公司 输电线路行波测量的自调零积分电路、测量电路及方法
CN114690822B (zh) * 2022-03-24 2023-11-14 南通大学 一种光敏二极管的暗电流补偿电路

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3609365A (en) * 1967-09-01 1971-09-28 Santa Barbara Res Center Radiometer arrangement and control circuit therefor
US3684378A (en) * 1970-09-04 1972-08-15 Joseph S Lord Dark current correction circuit for photosensing devices
GB1511492A (en) * 1974-08-14 1978-05-17 Hawker Siddeley Dynamics Ltd Amplification of electrical signals in imaging systems
IT1048562B (it) * 1975-10-16 1980-12-20 Durst Ag Circuito di misura per un fotometro

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008523872A (ja) * 2004-12-17 2008-07-10 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 連続的な検出器補正に対するパルスx線

Also Published As

Publication number Publication date
GR70063B (ja) 1982-07-26
ES495276A0 (es) 1981-11-01
MX148233A (es) 1983-03-28
EP0026108A3 (en) 1982-04-07
DK401680A (da) 1981-03-25
ES8200478A1 (es) 1981-11-01
EP0026108A2 (en) 1981-04-01
BR8006060A (pt) 1981-04-07

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