JPS5646299U - - Google Patents
Info
- Publication number
- JPS5646299U JPS5646299U JP12654779U JP12654779U JPS5646299U JP S5646299 U JPS5646299 U JP S5646299U JP 12654779 U JP12654779 U JP 12654779U JP 12654779 U JP12654779 U JP 12654779U JP S5646299 U JPS5646299 U JP S5646299U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
- Structure Of Receivers (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12654779U JPS5812477Y2 (en) | 1979-09-13 | 1979-09-13 | Shield structure of high frequency equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12654779U JPS5812477Y2 (en) | 1979-09-13 | 1979-09-13 | Shield structure of high frequency equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5646299U true JPS5646299U (en) | 1981-04-24 |
JPS5812477Y2 JPS5812477Y2 (en) | 1983-03-09 |
Family
ID=29358443
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12654779U Expired JPS5812477Y2 (en) | 1979-09-13 | 1979-09-13 | Shield structure of high frequency equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5812477Y2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59153154A (en) * | 1983-02-21 | 1984-09-01 | Jeol Ltd | Electron beam analytical method and apparatus |
JPS6433843A (en) * | 1987-07-29 | 1989-02-03 | Hitachi Ltd | Secondary ion mass spectrometer |
-
1979
- 1979-09-13 JP JP12654779U patent/JPS5812477Y2/en not_active Expired
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59153154A (en) * | 1983-02-21 | 1984-09-01 | Jeol Ltd | Electron beam analytical method and apparatus |
JPS6433843A (en) * | 1987-07-29 | 1989-02-03 | Hitachi Ltd | Secondary ion mass spectrometer |
Also Published As
Publication number | Publication date |
---|---|
JPS5812477Y2 (en) | 1983-03-09 |