JPS5638878U - - Google Patents

Info

Publication number
JPS5638878U
JPS5638878U JP12126479U JP12126479U JPS5638878U JP S5638878 U JPS5638878 U JP S5638878U JP 12126479 U JP12126479 U JP 12126479U JP 12126479 U JP12126479 U JP 12126479U JP S5638878 U JPS5638878 U JP S5638878U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12126479U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP12126479U priority Critical patent/JPS5638878U/ja
Publication of JPS5638878U publication Critical patent/JPS5638878U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP12126479U 1979-08-31 1979-08-31 Pending JPS5638878U (OSRAM)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12126479U JPS5638878U (OSRAM) 1979-08-31 1979-08-31

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12126479U JPS5638878U (OSRAM) 1979-08-31 1979-08-31

Publications (1)

Publication Number Publication Date
JPS5638878U true JPS5638878U (OSRAM) 1981-04-11

Family

ID=29353418

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12126479U Pending JPS5638878U (OSRAM) 1979-08-31 1979-08-31

Country Status (1)

Country Link
JP (1) JPS5638878U (OSRAM)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61104269A (ja) * 1984-10-26 1986-05-22 Sony Tektronix Corp 素子特性測定装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61104269A (ja) * 1984-10-26 1986-05-22 Sony Tektronix Corp 素子特性測定装置

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