JPS5635774Y2 - - Google Patents

Info

Publication number
JPS5635774Y2
JPS5635774Y2 JP1976135500U JP13550076U JPS5635774Y2 JP S5635774 Y2 JPS5635774 Y2 JP S5635774Y2 JP 1976135500 U JP1976135500 U JP 1976135500U JP 13550076 U JP13550076 U JP 13550076U JP S5635774 Y2 JPS5635774 Y2 JP S5635774Y2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1976135500U
Other languages
Japanese (ja)
Other versions
JPS5353351U (US08063081-20111122-C00044.png
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1976135500U priority Critical patent/JPS5635774Y2/ja
Priority to US05/840,009 priority patent/US4141148A/en
Priority to DE2745243A priority patent/DE2745243C2/de
Publication of JPS5353351U publication Critical patent/JPS5353351U/ja
Application granted granted Critical
Publication of JPS5635774Y2 publication Critical patent/JPS5635774Y2/ja
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0002Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/28Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
  • Transmission Devices (AREA)
JP1976135500U 1976-10-08 1976-10-08 Expired JPS5635774Y2 (US08063081-20111122-C00044.png)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP1976135500U JPS5635774Y2 (US08063081-20111122-C00044.png) 1976-10-08 1976-10-08
US05/840,009 US4141148A (en) 1976-10-08 1977-10-06 Contour measuring apparatus
DE2745243A DE2745243C2 (de) 1976-10-08 1977-10-07 Vorrichtung zum Messen und Registrieren von Profilen

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1976135500U JPS5635774Y2 (US08063081-20111122-C00044.png) 1976-10-08 1976-10-08

Publications (2)

Publication Number Publication Date
JPS5353351U JPS5353351U (US08063081-20111122-C00044.png) 1978-05-08
JPS5635774Y2 true JPS5635774Y2 (US08063081-20111122-C00044.png) 1981-08-24

Family

ID=15153193

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1976135500U Expired JPS5635774Y2 (US08063081-20111122-C00044.png) 1976-10-08 1976-10-08

Country Status (3)

Country Link
US (1) US4141148A (US08063081-20111122-C00044.png)
JP (1) JPS5635774Y2 (US08063081-20111122-C00044.png)
DE (1) DE2745243C2 (US08063081-20111122-C00044.png)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5822084Y2 (ja) * 1978-02-22 1983-05-11 株式会社三豊製作所 形状測定器
US4326337A (en) * 1980-05-01 1982-04-27 Kawasaki Seitetsu Kabushiki Kaisha Measuring instrument for the profile of piled charge of a blast furnace
DE3152731C2 (de) * 1981-02-14 1986-11-27 Mitutoyo Mfg. Co., Ltd., Tokio/Tokyo Konturmeßinstrument
DE3105442C2 (de) 1981-02-14 1986-05-15 Mitutoyo Mfg. Co., Ltd., Tokio/Tokyo Konturmeßinstrument
US4377911A (en) * 1981-02-18 1983-03-29 Mitutoyo Mfg. Co., Ltd. Contour measuring instrument
GB2281779B (en) * 1993-09-14 1997-04-23 Rank Taylor Hobson Ltd Metrological instrument
GB2339287B (en) 1998-07-09 2002-12-24 Taylor Hobson Ltd Transducer circuit
JP3273026B2 (ja) * 1998-09-02 2002-04-08 株式会社ミツトヨ 表面追従型測定機
JP3548752B2 (ja) * 2001-06-01 2004-07-28 オムロン株式会社 変位検出装置
JP5301412B2 (ja) * 2009-10-21 2013-09-25 株式会社ミツトヨ 測定力制御装置
CN102121814B (zh) * 2010-12-21 2012-10-24 重庆江利圣特机械制造有限责任公司 一种工件垂直度测量工具
CN111412824B (zh) * 2020-04-21 2021-09-24 上海舜诺机械有限公司 一种扭矩传动轴扭转角度测量机构

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE853824C (de) * 1950-02-15 1952-12-08 Siemens Ag Geraet zur Pruefung der Schaufelprofile von Kreiselmaschinen
DE1040805B (de) * 1957-02-08 1958-10-09 Siemens Ag Schreibendes Tastmessgeraet
FR1174117A (fr) * 1957-04-04 1959-03-06 Onera (Off Nat Aerospatiale) Appareil pour la mesure des cotes d'aubes, ailettes de turbines et surfaces analogues
BE631942A (US08063081-20111122-C00044.png) * 1961-04-24
US3319341A (en) * 1966-01-19 1967-05-16 Pipe Machinery Company Profile indicator and recorder
DE1548242B2 (de) * 1966-03-07 1972-03-30 Jenoptik Jena GmbH, χ 6900 Jena Selbstregistrierendes ecolventenpruefgeraet
US3499227A (en) * 1968-05-06 1970-03-10 Caterpillar Tractor Co Contour recorder

Also Published As

Publication number Publication date
US4141148A (en) 1979-02-27
DE2745243C2 (de) 1985-10-24
DE2745243A1 (de) 1978-04-20
JPS5353351U (US08063081-20111122-C00044.png) 1978-05-08

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