JPS5618905B2 - - Google Patents
Info
- Publication number
- JPS5618905B2 JPS5618905B2 JP1969073A JP1969073A JPS5618905B2 JP S5618905 B2 JPS5618905 B2 JP S5618905B2 JP 1969073 A JP1969073 A JP 1969073A JP 1969073 A JP1969073 A JP 1969073A JP S5618905 B2 JPS5618905 B2 JP S5618905B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Apparatuses And Processes For Manufacturing Resistors (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
- Adjustable Resistors (AREA)
- Feedback Control In General (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19722207525 DE2207525C3 (de) | 1972-02-17 | Prüfgerät zum Testen von Potentiorn |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4893957A JPS4893957A (US07922777-20110412-C00004.png) | 1973-12-04 |
| JPS5618905B2 true JPS5618905B2 (US07922777-20110412-C00004.png) | 1981-05-02 |
Family
ID=5836258
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1969073A Expired JPS5618905B2 (US07922777-20110412-C00004.png) | 1972-02-17 | 1973-02-17 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US3852665A (US07922777-20110412-C00004.png) |
| JP (1) | JPS5618905B2 (US07922777-20110412-C00004.png) |
| FR (1) | FR2172399B1 (US07922777-20110412-C00004.png) |
| GB (1) | GB1418934A (US07922777-20110412-C00004.png) |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3969618A (en) * | 1974-11-29 | 1976-07-13 | Xerox Corporation | On line PROM handling system |
| JPS51141347A (en) * | 1975-05-30 | 1976-12-06 | Nippon Electric Co | Variable resistance examining device |
| JPS5482273A (en) * | 1977-12-14 | 1979-06-30 | Nakamatsu Yoshiro | System for measuring variable resistor |
| US4987372A (en) * | 1989-08-01 | 1991-01-22 | Lutron Electronics Co., Inc. | Potentiometer state sensing circuit |
| US6075370A (en) | 1998-03-27 | 2000-06-13 | Aladdin Enterprises, Inc. | Method of calibrating a potentiometer |
| US6181141B1 (en) * | 1999-01-22 | 2001-01-30 | Honeywell Inc. | Failsafe monitoring system for potentiometers and monitor interface |
| DE10031005A1 (de) * | 2000-06-30 | 2002-01-17 | Schleifring Und Appbau Gmbh | Selbstdiagnostizierendes Übertragungssstem-Intelligenter Schleifring |
| US7550981B2 (en) * | 2006-08-10 | 2009-06-23 | Honeywell International Inc. | Circuit and method for determining potentiometer wiper resistance |
| JP5843663B2 (ja) * | 2012-03-05 | 2016-01-13 | アズビル株式会社 | ポテンショメータの劣化診断方法 |
| CN103191868B (zh) * | 2013-04-07 | 2014-06-11 | 广东升威电子制品有限公司 | 电位器自动检测设备 |
| CN104122429B (zh) * | 2014-07-24 | 2016-09-21 | 富阳兴远仪器仪表经营部 | 微小电压测量装置 |
| CN104237644B (zh) * | 2014-09-28 | 2017-03-08 | 潘柯文 | 一种单双联电位器多功能测试电路 |
| CN105834128B (zh) * | 2016-06-14 | 2017-12-15 | 东莞市钺河自动化科技有限公司 | 一种电位器自动检测设备 |
| CN107490734A (zh) * | 2017-07-27 | 2017-12-19 | 成都国盛科技有限公司 | 玻璃釉电位器自动测试设备 |
| CN109683076B (zh) * | 2018-12-19 | 2021-06-08 | 芜湖恒美电热器具有限公司 | 发热芯外壳耐压自动测试装置 |
| CN110899152A (zh) * | 2019-12-05 | 2020-03-24 | 东莞市钺河自动化科技有限公司 | 自动拨盘电位器测试机 |
| CN113825085A (zh) * | 2021-08-17 | 2021-12-21 | 深圳市豪恩声学股份有限公司 | 一种音量电位器检测设备、系统及方法 |
| CN114878862B (zh) * | 2022-06-30 | 2022-09-09 | 南通玉蝶电子陶瓷有限公司 | 一种预调电位器测试机 |
| CN117310422B (zh) * | 2023-12-01 | 2024-02-23 | 四川永星电子有限公司 | 一种火工品电阻器性能测试方法及系统 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2840784A (en) * | 1953-12-01 | 1958-06-24 | Western Electric Co | Method of testing electrical devices |
| US3160810A (en) * | 1960-06-20 | 1964-12-08 | Sperry Rand Corp | Potentiometer linearity testing machine with means to prevent grooving of wiper |
| US3094212A (en) * | 1961-12-14 | 1963-06-18 | Gen Precision Inc | Automatic component tester |
| US3457503A (en) * | 1965-01-13 | 1969-07-22 | Litton Industries Inc | Potentiometer linearity and conformity checking apparatus including program storage means |
| FR1498864A (fr) * | 1965-11-15 | 1967-10-20 | Ibm | Méthode et dispositif utilisés pour vérifier mécaniquement et électriquement laqualité des connexions soudées |
| FR2067120B1 (US07922777-20110412-C00004.png) * | 1969-11-07 | 1974-06-14 | Cit Alcatel |
-
1973
- 1973-02-12 US US00332008A patent/US3852665A/en not_active Expired - Lifetime
- 1973-02-15 GB GB756773A patent/GB1418934A/en not_active Expired
- 1973-02-16 FR FR7305662A patent/FR2172399B1/fr not_active Expired
- 1973-02-17 JP JP1969073A patent/JPS5618905B2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| DE2207525B2 (de) | 1976-03-25 |
| GB1418934A (en) | 1975-12-24 |
| DE2207525A1 (de) | 1973-10-04 |
| FR2172399A1 (US07922777-20110412-C00004.png) | 1973-09-28 |
| US3852665A (en) | 1974-12-03 |
| FR2172399B1 (US07922777-20110412-C00004.png) | 1976-06-11 |
| JPS4893957A (US07922777-20110412-C00004.png) | 1973-12-04 |
