JPS5616547Y2 - - Google Patents
Info
- Publication number
- JPS5616547Y2 JPS5616547Y2 JP12414676U JP12414676U JPS5616547Y2 JP S5616547 Y2 JPS5616547 Y2 JP S5616547Y2 JP 12414676 U JP12414676 U JP 12414676U JP 12414676 U JP12414676 U JP 12414676U JP S5616547 Y2 JPS5616547 Y2 JP S5616547Y2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12414676U JPS5616547Y2 (fr) | 1976-09-14 | 1976-09-14 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12414676U JPS5616547Y2 (fr) | 1976-09-14 | 1976-09-14 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5341071U JPS5341071U (fr) | 1978-04-10 |
JPS5616547Y2 true JPS5616547Y2 (fr) | 1981-04-17 |
Family
ID=28733559
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12414676U Expired JPS5616547Y2 (fr) | 1976-09-14 | 1976-09-14 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5616547Y2 (fr) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1997004327A1 (fr) * | 1995-07-20 | 1997-02-06 | Advantest Corporation | Dispositif pour tester un semiconducteur couple avec une horloge externe |
WO2003060533A1 (fr) * | 2002-01-10 | 2003-07-24 | Advantest Corporation | Dispositif pour tester la lsi a mesurer, analyseur de gigue et detecteur de dephasage |
WO2003091742A1 (fr) * | 2002-04-26 | 2003-11-06 | Advantest Corporation | Dispositif d'essai a semi-conducteurs |
-
1976
- 1976-09-14 JP JP12414676U patent/JPS5616547Y2/ja not_active Expired
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1997004327A1 (fr) * | 1995-07-20 | 1997-02-06 | Advantest Corporation | Dispositif pour tester un semiconducteur couple avec une horloge externe |
WO2003060533A1 (fr) * | 2002-01-10 | 2003-07-24 | Advantest Corporation | Dispositif pour tester la lsi a mesurer, analyseur de gigue et detecteur de dephasage |
WO2003091742A1 (fr) * | 2002-04-26 | 2003-11-06 | Advantest Corporation | Dispositif d'essai a semi-conducteurs |
Also Published As
Publication number | Publication date |
---|---|
JPS5341071U (fr) | 1978-04-10 |