JPS5616547Y2 - - Google Patents

Info

Publication number
JPS5616547Y2
JPS5616547Y2 JP12414676U JP12414676U JPS5616547Y2 JP S5616547 Y2 JPS5616547 Y2 JP S5616547Y2 JP 12414676 U JP12414676 U JP 12414676U JP 12414676 U JP12414676 U JP 12414676U JP S5616547 Y2 JPS5616547 Y2 JP S5616547Y2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP12414676U
Other languages
Japanese (ja)
Other versions
JPS5341071U (Direct
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP12414676U priority Critical patent/JPS5616547Y2/ja
Publication of JPS5341071U publication Critical patent/JPS5341071U/ja
Application granted granted Critical
Publication of JPS5616547Y2 publication Critical patent/JPS5616547Y2/ja
Expired legal-status Critical Current

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Landscapes

  • Tests Of Electronic Circuits (AREA)
JP12414676U 1976-09-14 1976-09-14 Expired JPS5616547Y2 (Direct)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12414676U JPS5616547Y2 (Direct) 1976-09-14 1976-09-14

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12414676U JPS5616547Y2 (Direct) 1976-09-14 1976-09-14

Publications (2)

Publication Number Publication Date
JPS5341071U JPS5341071U (Direct) 1978-04-10
JPS5616547Y2 true JPS5616547Y2 (Direct) 1981-04-17

Family

ID=28733559

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12414676U Expired JPS5616547Y2 (Direct) 1976-09-14 1976-09-14

Country Status (1)

Country Link
JP (1) JPS5616547Y2 (Direct)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997004327A1 (en) * 1995-07-20 1997-02-06 Advantest Corporation Semiconductor tester synchronized with external clock
WO2003060533A1 (en) * 2002-01-10 2003-07-24 Advantest Corporation Device for testing lsi to be measured, jitter analyzer, and phase difference detector
WO2003091742A1 (fr) * 2002-04-26 2003-11-06 Advantest Corporation Dispositif d'essai a semi-conducteurs

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997004327A1 (en) * 1995-07-20 1997-02-06 Advantest Corporation Semiconductor tester synchronized with external clock
WO2003060533A1 (en) * 2002-01-10 2003-07-24 Advantest Corporation Device for testing lsi to be measured, jitter analyzer, and phase difference detector
WO2003091742A1 (fr) * 2002-04-26 2003-11-06 Advantest Corporation Dispositif d'essai a semi-conducteurs

Also Published As

Publication number Publication date
JPS5341071U (Direct) 1978-04-10

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