JPS56154652A - Dew point hygrometer with continuous equalizer - Google Patents

Dew point hygrometer with continuous equalizer

Info

Publication number
JPS56154652A
JPS56154652A JP4426081A JP4426081A JPS56154652A JP S56154652 A JPS56154652 A JP S56154652A JP 4426081 A JP4426081 A JP 4426081A JP 4426081 A JP4426081 A JP 4426081A JP S56154652 A JPS56154652 A JP S56154652A
Authority
JP
Japan
Prior art keywords
dew point
point hygrometer
equalizer
continuous
continuous equalizer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4426081A
Other languages
English (en)
Inventor
Benetsuto Heizu Jiyun Sutanrii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
PerkinElmer Inc
Original Assignee
EG&G Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by EG&G Inc filed Critical EG&G Inc
Publication of JPS56154652A publication Critical patent/JPS56154652A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/56—Investigating or analyzing materials by the use of thermal means by investigating moisture content
    • G01N25/66—Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point
    • G01N25/68—Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point by varying the temperature of a condensing surface

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
JP4426081A 1980-03-28 1981-03-27 Dew point hygrometer with continuous equalizer Pending JPS56154652A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/135,127 US4345455A (en) 1980-03-28 1980-03-28 Dew point hygrometer with continuous balancing system

Publications (1)

Publication Number Publication Date
JPS56154652A true JPS56154652A (en) 1981-11-30

Family

ID=22466680

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4426081A Pending JPS56154652A (en) 1980-03-28 1981-03-27 Dew point hygrometer with continuous equalizer

Country Status (5)

Country Link
US (1) US4345455A (ja)
EP (1) EP0036913B1 (ja)
JP (1) JPS56154652A (ja)
CA (1) CA1135528A (ja)
DE (1) DE3071803D1 (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59170754A (ja) * 1983-03-16 1984-09-27 Tokyo Hikari Denshi Kogyo Kk 露点計
JPS62178356U (ja) * 1986-04-30 1987-11-12
JP2012093221A (ja) * 2010-10-27 2012-05-17 Yamatake Corp 鏡面冷却式センサ

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4579462A (en) * 1985-05-20 1986-04-01 Trans-Met Engineering, Inc. Dew point measuring apparatus
US5022045A (en) * 1985-08-06 1991-06-04 Elliott Stanley B Optical-type, phase transition humidity-responsive devices
CA1280910C (en) * 1988-11-02 1991-03-05 Paul Siska Dew point analyzer
GB8628610D0 (en) * 1986-11-29 1987-01-07 Emi Plc Thorn Temperature sensing arrangement
US4956538A (en) * 1988-09-09 1990-09-11 Texas Instruments, Incorporated Method and apparatus for real-time wafer temperature measurement using infrared pyrometry in advanced lamp-heated rapid thermal processors
US4891499A (en) * 1988-09-09 1990-01-02 Texas Instruments Incorporated Method and apparatus for real-time wafer temperature uniformity control and slip-free heating in lamp heated single-wafer rapid thermal processing systems
US5470154A (en) * 1991-04-18 1995-11-28 Osaka Sanso Kogyo Ltd. Method of cleaning the reflector mirror in an optical dew point meter and an optical dew point meter equipped with a cleaning device
JP3328555B2 (ja) * 1997-08-19 2002-09-24 株式会社日清製粉グループ本社 微粉体の帯電量制御方法および装置ならびに微粉体の散布方法および装置
JP4871599B2 (ja) * 2006-01-20 2012-02-08 日立住友重機械建機クレーン株式会社 クレーンおよびクレーンの分解方法
US8764414B2 (en) * 2011-11-07 2014-07-01 Bha Altair, Llc System for detecting contaminants in an intake flow of a compressor
US10444172B2 (en) * 2015-11-13 2019-10-15 Roscid Technologies, Inc. Chilled mirror hygrometer

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4415427Y1 (ja) * 1966-05-12 1969-07-03
JPS5019839U (ja) * 1973-06-25 1975-03-06

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3269A (en) * 1843-09-14 Xoltx new new
US2624195A (en) * 1946-10-25 1953-01-06 Borg George W Corp Dew point hygrometer
US2720107A (en) * 1953-01-29 1955-10-11 Wallace & Tiernan Inc Dew-point hygrometer
NL89176C (ja) * 1955-11-22
US3077763A (en) * 1959-01-30 1963-02-19 Leuna Werke Veb Low gas moisture measuring apparatus
US3280618A (en) * 1961-12-11 1966-10-25 Honeywell Inc Humidity sensing apparatus
US3195344A (en) * 1963-01-28 1965-07-20 Cambridge Systems Inc Dewpoint measuring system
US3269185A (en) * 1963-01-28 1966-08-30 Cambridge Systems Inc Dewpoint sensing structure
US3142986A (en) * 1963-05-10 1964-08-04 Ind Instr Inc Thermoelectric dew point hygrometer
US3252319A (en) * 1964-01-06 1966-05-24 Ind Instr Inc Dew point device with proportional control circuit
US3195345A (en) * 1964-05-11 1965-07-20 Cambridge Systems Inc Thermoelectric dewpoint determining system
US3623356A (en) * 1969-12-18 1971-11-30 Eg & G Inc Dew point hygrometer
US4083224A (en) * 1975-09-29 1978-04-11 The University Of Sydney Phase transition detector
US4216669A (en) * 1978-10-06 1980-08-12 General Eastern Instruments Corporation Contaminant error reduction system for dew point hygrometers
US4335597A (en) * 1980-03-28 1982-06-22 Eg & G, Inc. Dew point hygrometer with two cooled reflective surfaces

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4415427Y1 (ja) * 1966-05-12 1969-07-03
JPS5019839U (ja) * 1973-06-25 1975-03-06

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59170754A (ja) * 1983-03-16 1984-09-27 Tokyo Hikari Denshi Kogyo Kk 露点計
JPH0376412B2 (ja) * 1983-03-16 1991-12-05 Tokyo Hikari Denshi Kogyo Kk
JPS62178356U (ja) * 1986-04-30 1987-11-12
JP2012093221A (ja) * 2010-10-27 2012-05-17 Yamatake Corp 鏡面冷却式センサ

Also Published As

Publication number Publication date
EP0036913B1 (en) 1986-10-15
DE3071803D1 (en) 1986-11-20
EP0036913A2 (en) 1981-10-07
US4345455A (en) 1982-08-24
EP0036913A3 (en) 1982-03-17
CA1135528A (en) 1982-11-16

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