JPS56125900A - Device for checking appearance of electronic part - Google Patents

Device for checking appearance of electronic part

Info

Publication number
JPS56125900A
JPS56125900A JP2961380A JP2961380A JPS56125900A JP S56125900 A JPS56125900 A JP S56125900A JP 2961380 A JP2961380 A JP 2961380A JP 2961380 A JP2961380 A JP 2961380A JP S56125900 A JPS56125900 A JP S56125900A
Authority
JP
Japan
Prior art keywords
electronic part
checking appearance
checking
appearance
electronic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2961380A
Other languages
Japanese (ja)
Other versions
JPH0113052B2 (en
Inventor
Takashi Takeuchi
Takaaki Shirai
Tatsuo Koizumi
Shigetoshi Ishizuka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP2961380A priority Critical patent/JPS56125900A/en
Publication of JPS56125900A publication Critical patent/JPS56125900A/en
Publication of JPH0113052B2 publication Critical patent/JPH0113052B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2961380A 1980-03-07 1980-03-07 Device for checking appearance of electronic part Granted JPS56125900A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2961380A JPS56125900A (en) 1980-03-07 1980-03-07 Device for checking appearance of electronic part

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2961380A JPS56125900A (en) 1980-03-07 1980-03-07 Device for checking appearance of electronic part

Publications (2)

Publication Number Publication Date
JPS56125900A true JPS56125900A (en) 1981-10-02
JPH0113052B2 JPH0113052B2 (en) 1989-03-03

Family

ID=12280915

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2961380A Granted JPS56125900A (en) 1980-03-07 1980-03-07 Device for checking appearance of electronic part

Country Status (1)

Country Link
JP (1) JPS56125900A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61191000A (en) * 1985-02-19 1986-08-25 日本シイエムケイ株式会社 Method and apparatus for discriminating surface and back andfront and rear of frinted wiring board
JP2003014654A (en) * 2001-06-27 2003-01-15 Ngk Spark Plug Co Ltd Substrate inspection method, inspection device therefor and method for manufacturing product for electronic machinery

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7313044B2 (en) 2019-09-06 2023-07-24 山本光学株式会社 glasses

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4821629U (en) * 1971-07-16 1973-03-12

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4821629U (en) * 1971-07-16 1973-03-12

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61191000A (en) * 1985-02-19 1986-08-25 日本シイエムケイ株式会社 Method and apparatus for discriminating surface and back andfront and rear of frinted wiring board
JPH0548000B2 (en) * 1985-02-19 1993-07-20 Nippon Cmk Kk
JP2003014654A (en) * 2001-06-27 2003-01-15 Ngk Spark Plug Co Ltd Substrate inspection method, inspection device therefor and method for manufacturing product for electronic machinery
JP4709432B2 (en) * 2001-06-27 2011-06-22 日本特殊陶業株式会社 Substrate inspection method and inspection apparatus, and electronic device product manufacturing method

Also Published As

Publication number Publication date
JPH0113052B2 (en) 1989-03-03

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