JPS56121150U - - Google Patents

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Publication number
JPS56121150U
JPS56121150U JP1830080U JP1830080U JPS56121150U JP S56121150 U JPS56121150 U JP S56121150U JP 1830080 U JP1830080 U JP 1830080U JP 1830080 U JP1830080 U JP 1830080U JP S56121150 U JPS56121150 U JP S56121150U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1830080U
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1830080U priority Critical patent/JPS56121150U/ja
Publication of JPS56121150U publication Critical patent/JPS56121150U/ja
Pending legal-status Critical Current

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  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP1830080U 1980-02-18 1980-02-18 Pending JPS56121150U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1830080U JPS56121150U (ja) 1980-02-18 1980-02-18

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1830080U JPS56121150U (ja) 1980-02-18 1980-02-18

Publications (1)

Publication Number Publication Date
JPS56121150U true JPS56121150U (ja) 1981-09-16

Family

ID=29614611

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1830080U Pending JPS56121150U (ja) 1980-02-18 1980-02-18

Country Status (1)

Country Link
JP (1) JPS56121150U (ja)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007147583A (ja) * 2005-01-13 2007-06-14 Komag Inc ワークピースを光学的に検査するテストヘッド
JP2011076669A (ja) * 2009-09-30 2011-04-14 Hitachi High-Technologies Corp 磁気ディスクの両面欠陥検査方法及びその装置
JP2011096305A (ja) * 2009-10-28 2011-05-12 Hitachi High-Technologies Corp 光学式磁気ディスク両面欠陥検査装置及びその方法
JP2011137721A (ja) * 2009-12-28 2011-07-14 Hitachi High-Technologies Corp 光学式磁気ディスク欠陥検査方法及びその装置
JP2011159330A (ja) * 2010-01-29 2011-08-18 Hitachi High-Technologies Corp 磁気ディスク検査方法及びその装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5328772B2 (ja) * 1975-05-14 1978-08-16
JPS53102792A (en) * 1977-02-21 1978-09-07 Hitachi Ltd Simultaneous inspecting apparatus of inside and outside of body to be inspected

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5328772B2 (ja) * 1975-05-14 1978-08-16
JPS53102792A (en) * 1977-02-21 1978-09-07 Hitachi Ltd Simultaneous inspecting apparatus of inside and outside of body to be inspected

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007147583A (ja) * 2005-01-13 2007-06-14 Komag Inc ワークピースを光学的に検査するテストヘッド
JP2011076669A (ja) * 2009-09-30 2011-04-14 Hitachi High-Technologies Corp 磁気ディスクの両面欠陥検査方法及びその装置
JP2011096305A (ja) * 2009-10-28 2011-05-12 Hitachi High-Technologies Corp 光学式磁気ディスク両面欠陥検査装置及びその方法
JP2011137721A (ja) * 2009-12-28 2011-07-14 Hitachi High-Technologies Corp 光学式磁気ディスク欠陥検査方法及びその装置
JP2011159330A (ja) * 2010-01-29 2011-08-18 Hitachi High-Technologies Corp 磁気ディスク検査方法及びその装置

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