JPS56121150U - - Google Patents
Info
- Publication number
- JPS56121150U JPS56121150U JP1830080U JP1830080U JPS56121150U JP S56121150 U JPS56121150 U JP S56121150U JP 1830080 U JP1830080 U JP 1830080U JP 1830080 U JP1830080 U JP 1830080U JP S56121150 U JPS56121150 U JP S56121150U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1830080U JPS56121150U (ja) | 1980-02-18 | 1980-02-18 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1830080U JPS56121150U (ja) | 1980-02-18 | 1980-02-18 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS56121150U true JPS56121150U (ja) | 1981-09-16 |
Family
ID=29614611
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1830080U Pending JPS56121150U (ja) | 1980-02-18 | 1980-02-18 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56121150U (ja) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007147583A (ja) * | 2005-01-13 | 2007-06-14 | Komag Inc | ワークピースを光学的に検査するテストヘッド |
JP2011076669A (ja) * | 2009-09-30 | 2011-04-14 | Hitachi High-Technologies Corp | 磁気ディスクの両面欠陥検査方法及びその装置 |
JP2011096305A (ja) * | 2009-10-28 | 2011-05-12 | Hitachi High-Technologies Corp | 光学式磁気ディスク両面欠陥検査装置及びその方法 |
JP2011137721A (ja) * | 2009-12-28 | 2011-07-14 | Hitachi High-Technologies Corp | 光学式磁気ディスク欠陥検査方法及びその装置 |
JP2011159330A (ja) * | 2010-01-29 | 2011-08-18 | Hitachi High-Technologies Corp | 磁気ディスク検査方法及びその装置 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5328772B2 (ja) * | 1975-05-14 | 1978-08-16 | ||
JPS53102792A (en) * | 1977-02-21 | 1978-09-07 | Hitachi Ltd | Simultaneous inspecting apparatus of inside and outside of body to be inspected |
-
1980
- 1980-02-18 JP JP1830080U patent/JPS56121150U/ja active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5328772B2 (ja) * | 1975-05-14 | 1978-08-16 | ||
JPS53102792A (en) * | 1977-02-21 | 1978-09-07 | Hitachi Ltd | Simultaneous inspecting apparatus of inside and outside of body to be inspected |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007147583A (ja) * | 2005-01-13 | 2007-06-14 | Komag Inc | ワークピースを光学的に検査するテストヘッド |
JP2011076669A (ja) * | 2009-09-30 | 2011-04-14 | Hitachi High-Technologies Corp | 磁気ディスクの両面欠陥検査方法及びその装置 |
JP2011096305A (ja) * | 2009-10-28 | 2011-05-12 | Hitachi High-Technologies Corp | 光学式磁気ディスク両面欠陥検査装置及びその方法 |
JP2011137721A (ja) * | 2009-12-28 | 2011-07-14 | Hitachi High-Technologies Corp | 光学式磁気ディスク欠陥検査方法及びその装置 |
JP2011159330A (ja) * | 2010-01-29 | 2011-08-18 | Hitachi High-Technologies Corp | 磁気ディスク検査方法及びその装置 |