JPS56112680U - - Google Patents
Info
- Publication number
- JPS56112680U JPS56112680U JP1022080U JP1022080U JPS56112680U JP S56112680 U JPS56112680 U JP S56112680U JP 1022080 U JP1022080 U JP 1022080U JP 1022080 U JP1022080 U JP 1022080U JP S56112680 U JPS56112680 U JP S56112680U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1022080U JPS56112680U (en:Method) | 1980-01-29 | 1980-01-29 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1022080U JPS56112680U (en:Method) | 1980-01-29 | 1980-01-29 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS56112680U true JPS56112680U (en:Method) | 1981-08-31 |
Family
ID=29606885
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1022080U Pending JPS56112680U (en:Method) | 1980-01-29 | 1980-01-29 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS56112680U (en:Method) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59155769A (ja) * | 1983-02-25 | 1984-09-04 | Seiko Epson Corp | 電子デイバイスの検査装置 |
-
1980
- 1980-01-29 JP JP1022080U patent/JPS56112680U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59155769A (ja) * | 1983-02-25 | 1984-09-04 | Seiko Epson Corp | 電子デイバイスの検査装置 |