JPS56105838U - - Google Patents

Info

Publication number
JPS56105838U
JPS56105838U JP377480U JP377480U JPS56105838U JP S56105838 U JPS56105838 U JP S56105838U JP 377480 U JP377480 U JP 377480U JP 377480 U JP377480 U JP 377480U JP S56105838 U JPS56105838 U JP S56105838U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP377480U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP377480U priority Critical patent/JPS56105838U/ja
Publication of JPS56105838U publication Critical patent/JPS56105838U/ja
Pending legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP377480U 1980-01-17 1980-01-17 Pending JPS56105838U (OSRAM)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP377480U JPS56105838U (OSRAM) 1980-01-17 1980-01-17

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP377480U JPS56105838U (OSRAM) 1980-01-17 1980-01-17

Publications (1)

Publication Number Publication Date
JPS56105838U true JPS56105838U (OSRAM) 1981-08-18

Family

ID=29600505

Family Applications (1)

Application Number Title Priority Date Filing Date
JP377480U Pending JPS56105838U (OSRAM) 1980-01-17 1980-01-17

Country Status (1)

Country Link
JP (1) JPS56105838U (OSRAM)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018059800A (ja) * 2016-10-05 2018-04-12 株式会社Ihi フレキシブル探触子の感度校正方法及び超音波探傷用対比試験片並びに超音波探傷方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018059800A (ja) * 2016-10-05 2018-04-12 株式会社Ihi フレキシブル探触子の感度校正方法及び超音波探傷用対比試験片並びに超音波探傷方法

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