JPS5596146A - Ultrasoniccwave inspection device - Google Patents
Ultrasoniccwave inspection deviceInfo
- Publication number
- JPS5596146A JPS5596146A JP368979A JP368979A JPS5596146A JP S5596146 A JPS5596146 A JP S5596146A JP 368979 A JP368979 A JP 368979A JP 368979 A JP368979 A JP 368979A JP S5596146 A JPS5596146 A JP S5596146A
- Authority
- JP
- Japan
- Prior art keywords
- ultrasoniccwave
- inspection device
- inspection
- ultrasoniccwave inspection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Ultra Sonic Daignosis Equipment (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP54003689A JPS6053626B2 (en) | 1979-01-16 | 1979-01-16 | Ultrasonic inspection device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP54003689A JPS6053626B2 (en) | 1979-01-16 | 1979-01-16 | Ultrasonic inspection device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5596146A true JPS5596146A (en) | 1980-07-22 |
JPS6053626B2 JPS6053626B2 (en) | 1985-11-26 |
Family
ID=11564360
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP54003689A Expired JPS6053626B2 (en) | 1979-01-16 | 1979-01-16 | Ultrasonic inspection device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6053626B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011107119A (en) * | 2009-11-16 | 2011-06-02 | Samsung Electro-Mechanics Co Ltd | Circuit pattern defect inspection method of substrate |
-
1979
- 1979-01-16 JP JP54003689A patent/JPS6053626B2/en not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011107119A (en) * | 2009-11-16 | 2011-06-02 | Samsung Electro-Mechanics Co Ltd | Circuit pattern defect inspection method of substrate |
Also Published As
Publication number | Publication date |
---|---|
JPS6053626B2 (en) | 1985-11-26 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS55134579A (en) | Inspecting device | |
DE3068054D1 (en) | Simultaneous-analysis device | |
JPS5687874A (en) | Test device | |
JPS555678A (en) | Ultrasoniccwave inspection device | |
IL60943A0 (en) | Dehumifidying device | |
JPS5516397A (en) | Xxray inspecting device | |
JPS5690240A (en) | Liquidddensity measuring device | |
JPS5663160A (en) | Sealdevice for airrtight device | |
JPS562241A (en) | Checking device | |
GB2061494B (en) | Inspection device | |
GB2045499B (en) | Anti-stringing device | |
GB2049431B (en) | Measuring device | |
GB2066959B (en) | Measuring device | |
JPS55106178A (en) | Bowlinggballlgame device | |
JPS55122539A (en) | Xxray inspecting device | |
JPS5619401A (en) | Measuring device | |
DE3070411D1 (en) | Segmented-display device | |
JPS54114990A (en) | Xxray inspecting device | |
JPS5522200A (en) | Inspection device | |
JPS555661A (en) | Ultrasoniccwave inspection device | |
JPS5663636A (en) | Dimensions testing device | |
JPS5686318A (en) | Measuring device | |
JPS5596146A (en) | Ultrasoniccwave inspection device | |
JPS5690241A (en) | Liquiddviscosity measuring device | |
JPS5611496A (en) | Checking device |