JPS5588148U - - Google Patents
Info
- Publication number
- JPS5588148U JPS5588148U JP16941979U JP16941979U JPS5588148U JP S5588148 U JPS5588148 U JP S5588148U JP 16941979 U JP16941979 U JP 16941979U JP 16941979 U JP16941979 U JP 16941979U JP S5588148 U JPS5588148 U JP S5588148U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16941979U JPS5588148U (en) | 1979-12-06 | 1979-12-06 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16941979U JPS5588148U (en) | 1979-12-06 | 1979-12-06 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5588148U true JPS5588148U (en) | 1980-06-18 |
Family
ID=29171474
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16941979U Pending JPS5588148U (en) | 1979-12-06 | 1979-12-06 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5588148U (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6175243A (en) * | 1984-09-19 | 1986-04-17 | Shimadzu Corp | 2-axis oscillating x rays stress measuring apparatus |
| JP2005515435A (en) * | 2002-01-21 | 2005-05-26 | エックスアールディ−トールズ ソシエタ ア レスポンサビリタ リミタータ | Diffractometer and diffraction analysis method |
| JP2007278944A (en) * | 2006-04-10 | 2007-10-25 | Rigaku Corp | X-ray diffractometer and control method therefor |
| JP2014106004A (en) * | 2012-11-22 | 2014-06-09 | Kowa Dennetsu Keiki:Kk | X-ray stress measurement device |
| JP2018124244A (en) * | 2017-02-03 | 2018-08-09 | 国立大学法人東北大学 | Portable three-axial stress measurement device |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2462374A (en) * | 1944-10-04 | 1949-02-22 | Philips Lab Inc | Stress analysis by x-ray diffraction |
-
1979
- 1979-12-06 JP JP16941979U patent/JPS5588148U/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2462374A (en) * | 1944-10-04 | 1949-02-22 | Philips Lab Inc | Stress analysis by x-ray diffraction |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6175243A (en) * | 1984-09-19 | 1986-04-17 | Shimadzu Corp | 2-axis oscillating x rays stress measuring apparatus |
| JP2005515435A (en) * | 2002-01-21 | 2005-05-26 | エックスアールディ−トールズ ソシエタ ア レスポンサビリタ リミタータ | Diffractometer and diffraction analysis method |
| JP2007278944A (en) * | 2006-04-10 | 2007-10-25 | Rigaku Corp | X-ray diffractometer and control method therefor |
| JP2014106004A (en) * | 2012-11-22 | 2014-06-09 | Kowa Dennetsu Keiki:Kk | X-ray stress measurement device |
| JP2018124244A (en) * | 2017-02-03 | 2018-08-09 | 国立大学法人東北大学 | Portable three-axial stress measurement device |