JPS556854A - Lead frame strength test method of semiconductor device - Google Patents

Lead frame strength test method of semiconductor device

Info

Publication number
JPS556854A
JPS556854A JP7900778A JP7900778A JPS556854A JP S556854 A JPS556854 A JP S556854A JP 7900778 A JP7900778 A JP 7900778A JP 7900778 A JP7900778 A JP 7900778A JP S556854 A JPS556854 A JP S556854A
Authority
JP
Japan
Prior art keywords
lead frame
semiconductor device
trembler
test method
vibration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7900778A
Other languages
Japanese (ja)
Inventor
Kazutoshi Miyamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP7900778A priority Critical patent/JPS556854A/en
Publication of JPS556854A publication Critical patent/JPS556854A/en
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE: To test strength simply and for a short time, by fixing one portion of a semiconductor device, by mounting the lead frames to a trembler of a vibration tester and by applying vibration to the lead frames from the trembler.
CONSTITUTION: Each lead frame 2a-1W2a-n superficially projected on a flank of one side of a semiconductor device 1 is each installed to a support base 4 for fixing, and each lead frame 2b-1W2b-n superficially projected on a flank of the other side is severally disposed to a trembler 5 of a vibration tester. Consequently, vibration with arbitrary frequency and amplitude generated from the trembler 5 is applied to each lead frame, and time untile the frames are cut is measured, thus testing the strength.
COPYRIGHT: (C)1980,JPO&Japio
JP7900778A 1978-06-28 1978-06-28 Lead frame strength test method of semiconductor device Pending JPS556854A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7900778A JPS556854A (en) 1978-06-28 1978-06-28 Lead frame strength test method of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7900778A JPS556854A (en) 1978-06-28 1978-06-28 Lead frame strength test method of semiconductor device

Publications (1)

Publication Number Publication Date
JPS556854A true JPS556854A (en) 1980-01-18

Family

ID=13677881

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7900778A Pending JPS556854A (en) 1978-06-28 1978-06-28 Lead frame strength test method of semiconductor device

Country Status (1)

Country Link
JP (1) JPS556854A (en)

Similar Documents

Publication Publication Date Title
DE3065212D1 (en) Method and apparatus for the automatic testing of semi-conductor components
JPS5218352A (en) Frequency generator for detail test
EP0278669A3 (en) Methods and apparatus for frequency response analysis
IT1034698B (en) SECOND RY TEST EQUIPMENT FOR VALIDATION OF VALUES
ES453583A1 (en) Method and apparatus for testing the quality of cast iron pieces especially spheroidal cast-iron pieces
IT1143835B (en) PROCEDURE AND DEVICE FOR TESTING THE OPERATION OF AN ANTI-LOCK ADJUSTMENT DEVICE
GB2119934B (en) Vibration testing apparatus
JPS556854A (en) Lead frame strength test method of semiconductor device
DK324877A (en) APPARATUS FOR TESTING VIBRATION DAMPERS MOUNTED O SUSPENSED VEHICLES
JPS51121356A (en) Anti-vibration bench device
GB8303689D0 (en) Vibration testing apparatus
IT1143563B (en) ANTISERO FOR THE THROMBOSIS TEST
IT1151704B (en) APPARATUS FOR FIXING COMPONENTS THROUGH HIGH FREQUENCY VIBRATIONS
JPS5322757A (en) Testing apparatus of electric a ppliances
JPS52487A (en) Vibration tester
SU615970A1 (en) Vibration metal-drawing apparatus
DE3376586D1 (en) Apparatus for testing the purity of noble metal shaped bodies
BE844995A (en) ELECTRONIC DEVICE FOR ADJUSTING BY MEASURING THE TENSION THE UNLOADING OF A SUBSTANCE ON A SUPPORT
GB1550062A (en) Apparatus for measuring q-quality of oscillatory circuit components
DK442884A (en) PROCEDURE AND APPARATUS FOR TRANSMISSION OF ACOUSTIC INFORMATION AS SUBJECT VIBRATIONS
JPS542170A (en) Vibration supervisory apparatus
SU690368A1 (en) Method of measuring logarithmic decrement of oscillatory system
SU557850A1 (en) The method of obtaining thickenings on pipelines
SU598227A1 (en) Amplitude analyzer
JPS51134681A (en) Defective material detector