JPS5562323A - Multiple luminous flux spectrophotometer - Google Patents
Multiple luminous flux spectrophotometerInfo
- Publication number
- JPS5562323A JPS5562323A JP13453978A JP13453978A JPS5562323A JP S5562323 A JPS5562323 A JP S5562323A JP 13453978 A JP13453978 A JP 13453978A JP 13453978 A JP13453978 A JP 13453978A JP S5562323 A JPS5562323 A JP S5562323A
- Authority
- JP
- Japan
- Prior art keywords
- deltas
- response
- scanning
- slit width
- peak
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000004907 flux Effects 0.000 title 1
- 238000005070 sampling Methods 0.000 abstract 2
- 238000001228 spectrum Methods 0.000 abstract 2
- 238000005259 measurement Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
Abstract
PURPOSE:To ensure a high-efficiency measurement of the spectrum with a reduced amount of the distortion and over the entire scanning region by securing an automatic control to the response of the device, the slit width and the scanning velocity each in accordance with the shape of the spectrum. CONSTITUTION:When the photometric value with wavelength lambdan is referred to an Sn and the photometric value at the preceding sampling point and with wavelength lambdan-1 is Sn-1 each, differential ¦DELTAS¦ Sn-¦Sn-1¦ features a large value within the range from peak rise point 42 through peak end point 42. Then differential ¦DELTAS¦ is calculated at every sampling point, and the scanning is carried out with the standard scanning velocity, response and slit width each while ¦DELTAS¦ is small. When DELTAS increases, the control signal is delivered from CPU20 to delay the scanning velocity. At the same time, the response is accelerated with the slit width narrowed. As a result, an accurate reproduction is ensured with no sharp peak nor distortion.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13453978A JPS6058809B2 (en) | 1978-11-02 | 1978-11-02 | Double beam spectrophotometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13453978A JPS6058809B2 (en) | 1978-11-02 | 1978-11-02 | Double beam spectrophotometer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5562323A true JPS5562323A (en) | 1980-05-10 |
| JPS6058809B2 JPS6058809B2 (en) | 1985-12-21 |
Family
ID=15130674
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13453978A Expired JPS6058809B2 (en) | 1978-11-02 | 1978-11-02 | Double beam spectrophotometer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6058809B2 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60135829A (en) * | 1983-12-26 | 1985-07-19 | Shimadzu Corp | Spectrophotometer |
| WO2012147551A1 (en) * | 2011-04-27 | 2012-11-01 | 株式会社日立ハイテクノロジーズ | Spectrophotometer and method for determining slit conditions thereof |
| JP2017120200A (en) * | 2015-12-28 | 2017-07-06 | 国立研究開発法人産業技術総合研究所 | Spectral radiation measuring device |
-
1978
- 1978-11-02 JP JP13453978A patent/JPS6058809B2/en not_active Expired
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60135829A (en) * | 1983-12-26 | 1985-07-19 | Shimadzu Corp | Spectrophotometer |
| JPH0522856B2 (en) * | 1983-12-26 | 1993-03-30 | Shimadzu Corp | |
| WO2012147551A1 (en) * | 2011-04-27 | 2012-11-01 | 株式会社日立ハイテクノロジーズ | Spectrophotometer and method for determining slit conditions thereof |
| JP2017120200A (en) * | 2015-12-28 | 2017-07-06 | 国立研究開発法人産業技術総合研究所 | Spectral radiation measuring device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6058809B2 (en) | 1985-12-21 |
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