JPS5549282U - - Google Patents
Info
- Publication number
- JPS5549282U JPS5549282U JP13384278U JP13384278U JPS5549282U JP S5549282 U JPS5549282 U JP S5549282U JP 13384278 U JP13384278 U JP 13384278U JP 13384278 U JP13384278 U JP 13384278U JP S5549282 U JPS5549282 U JP S5549282U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13384278U JPS5819494Y2 (ja) | 1978-09-28 | 1978-09-28 | 半導体素子の特性選別装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13384278U JPS5819494Y2 (ja) | 1978-09-28 | 1978-09-28 | 半導体素子の特性選別装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5549282U true JPS5549282U (OSRAM) | 1980-03-31 |
| JPS5819494Y2 JPS5819494Y2 (ja) | 1983-04-21 |
Family
ID=29102672
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13384278U Expired JPS5819494Y2 (ja) | 1978-09-28 | 1978-09-28 | 半導体素子の特性選別装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5819494Y2 (OSRAM) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5930847U (ja) * | 1982-08-20 | 1984-02-25 | ダイセル化学工業株式会社 | 複合袋 |
| JP2013242250A (ja) * | 2012-05-22 | 2013-12-05 | Hioki Ee Corp | ダイオード検査装置及びダイオード検査方法 |
-
1978
- 1978-09-28 JP JP13384278U patent/JPS5819494Y2/ja not_active Expired
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5930847U (ja) * | 1982-08-20 | 1984-02-25 | ダイセル化学工業株式会社 | 複合袋 |
| JP2013242250A (ja) * | 2012-05-22 | 2013-12-05 | Hioki Ee Corp | ダイオード検査装置及びダイオード検査方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5819494Y2 (ja) | 1983-04-21 |