JPS5548262B2 - - Google Patents
Info
- Publication number
- JPS5548262B2 JPS5548262B2 JP11781777A JP11781777A JPS5548262B2 JP S5548262 B2 JPS5548262 B2 JP S5548262B2 JP 11781777 A JP11781777 A JP 11781777A JP 11781777 A JP11781777 A JP 11781777A JP S5548262 B2 JPS5548262 B2 JP S5548262B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Thermistors And Varistors (AREA)
- Testing Relating To Insulation (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US05/755,619 US4112362A (en) | 1976-12-30 | 1976-12-30 | Method for the nondestructive testing of voltage limiting blocks |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5384788A JPS5384788A (en) | 1978-07-26 |
| JPS5548262B2 true JPS5548262B2 (en:Method) | 1980-12-04 |
Family
ID=25039886
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11781777A Granted JPS5384788A (en) | 1976-12-30 | 1977-09-30 | Nonndestructive inspection for voltageecontrolled block |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US4112362A (en:Method) |
| JP (1) | JPS5384788A (en:Method) |
| DE (1) | DE2754391C3 (en:Method) |
| SE (1) | SE7709510L (en:Method) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4733175A (en) * | 1984-06-04 | 1988-03-22 | General Electric Company | Varistor defect detection by incipient hot spot observation |
| US5356218A (en) * | 1993-05-04 | 1994-10-18 | Motorola, Inc. | Probe for providing surface images |
| FR2728682B1 (fr) * | 1994-12-26 | 1997-01-31 | Commissariat Energie Atomique | Dispositif d'essai d'un element d'optique soumis a un rayonnement |
| JP3205483B2 (ja) * | 1995-05-11 | 2001-09-04 | 株式会社日立製作所 | 電力用酸化亜鉛素子の耐量推定方法、そのスクリーニング方法、及びこれらの方法を実施する装置 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2776402A (en) * | 1954-03-30 | 1957-01-01 | Schlumberger Well Surv Corp | Electrical well logging |
| US3090112A (en) * | 1960-01-14 | 1963-05-21 | Porter Co Inc H K | Method of determining leaks in lightning arresters and the like |
-
1976
- 1976-12-30 US US05/755,619 patent/US4112362A/en not_active Expired - Lifetime
-
1977
- 1977-08-24 SE SE7709510A patent/SE7709510L/xx unknown
- 1977-09-30 JP JP11781777A patent/JPS5384788A/ja active Granted
- 1977-12-07 DE DE2754391A patent/DE2754391C3/de not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| DE2754391C3 (de) | 1979-11-29 |
| DE2754391B2 (de) | 1979-04-12 |
| DE2754391A1 (de) | 1978-07-27 |
| SE7709510L (sv) | 1978-07-01 |
| JPS5384788A (en) | 1978-07-26 |
| US4112362A (en) | 1978-09-05 |