JPS5547702B2 - - Google Patents

Info

Publication number
JPS5547702B2
JPS5547702B2 JP6547373A JP6547373A JPS5547702B2 JP S5547702 B2 JPS5547702 B2 JP S5547702B2 JP 6547373 A JP6547373 A JP 6547373A JP 6547373 A JP6547373 A JP 6547373A JP S5547702 B2 JPS5547702 B2 JP S5547702B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP6547373A
Other languages
Japanese (ja)
Other versions
JPS4958880A (en:Method
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS4958880A publication Critical patent/JPS4958880A/ja
Publication of JPS5547702B2 publication Critical patent/JPS5547702B2/ja
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00Arrangements for displaying electric variables or waveforms
    • G01R13/20Cathode-ray oscilloscopes
    • G01R13/22Circuits therefor
    • G01R13/34Circuits for representing a single waveform by sampling, e.g. for very high frequencies
    • G01R13/342Circuits for representing a single waveform by sampling, e.g. for very high frequencies for displaying periodic H.F. signals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/18Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/02Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/035Measuring direction or magnitude of magnetic fields or magnetic flux using superconductive devices
    • G01R33/0354SQUIDS
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/02Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components
    • H03K19/195Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using superconductive devices
    • H03K19/1952Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using superconductive devices with electro-magnetic coupling of the control current
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S505/00Superconductor technology: apparatus, material, process
    • Y10S505/825Apparatus per se, device per se, or process of making or operating same
    • Y10S505/842Measuring and testing
    • Y10S505/843Electrical

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Measuring Magnetic Variables (AREA)
  • Superconductor Devices And Manufacturing Methods Thereof (AREA)
JP6547373A 1972-06-30 1973-06-12 Expired JPS5547702B2 (en:Method)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US26781072A 1972-06-30 1972-06-30

Publications (2)

Publication Number Publication Date
JPS4958880A JPS4958880A (en:Method) 1974-06-07
JPS5547702B2 true JPS5547702B2 (en:Method) 1980-12-02

Family

ID=23020218

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6547373A Expired JPS5547702B2 (en:Method) 1972-06-30 1973-06-12

Country Status (5)

Country Link
US (1) US3764905A (en:Method)
JP (1) JPS5547702B2 (en:Method)
DE (1) DE2330813A1 (en:Method)
FR (1) FR2191123B1 (en:Method)
GB (1) GB1412717A (en:Method)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3843895A (en) * 1973-06-29 1974-10-22 Ibm Two-way or circuit using josephson tunnelling technology
US3879715A (en) * 1973-12-28 1975-04-22 Ibm Damped josephson junction memory cell with inductively coupled resistive loop
US3983419A (en) * 1974-12-31 1976-09-28 International Business Machines - Ibm Analog waveform transducing circuit
US4245169A (en) * 1979-03-14 1981-01-13 The United States Of America As Represented By The Secretary Of Commerce Sampling circuit and method therefor
US4631423A (en) * 1979-12-20 1986-12-23 International Business Machines Corporation Ultra high resolution Josephson sampling technique
US4401900A (en) * 1979-12-20 1983-08-30 International Business Machines Corporation Ultra high resolution Josephson sampling technique
FR2481808A1 (fr) * 1980-05-05 1981-11-06 Commissariat Energie Atomique Procede d'elaboration et de reglage de capteur de flux magnetique a effet josephson
US4533840A (en) * 1982-09-13 1985-08-06 International Business Machines Corporation Soliton sampler
US4926067A (en) * 1987-09-28 1990-05-15 Hypres, Inc. Integrated superconducting sampling oscilloscope
EP0310249A1 (en) * 1987-09-28 1989-04-05 Hypres, Inc. Integrated superconducting sampling oscilloscope
US5272480A (en) * 1992-08-17 1993-12-21 Hewlett-Packard Company Track and hold circuit with continuously suppressed Josephson effect
US6734660B1 (en) * 2002-02-07 2004-05-11 Lockheed Martin Corporation Current sensor arrangement with test current generator

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2987631A (en) * 1958-07-14 1961-06-06 Little Inc A Electrical signal coupling circuit
US3259844A (en) * 1961-10-26 1966-07-05 Philips Corp Signal amplitude discriminator having a plurality of superconducting loops arranged to respond to the magnetic field produced by the signal
US3435337A (en) * 1964-12-11 1969-03-25 Trw Inc Superconductive fluxgate magnetometer
US3643237A (en) * 1969-12-30 1972-02-15 Ibm Multiple-junction tunnel devices
US3705393A (en) * 1970-06-30 1972-12-05 Ibm Superconducting memory array using weak links

Also Published As

Publication number Publication date
JPS4958880A (en:Method) 1974-06-07
GB1412717A (en) 1975-11-05
FR2191123B1 (en:Method) 1978-12-01
FR2191123A1 (en:Method) 1974-02-01
DE2330813A1 (de) 1974-01-17
US3764905A (en) 1973-10-09

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