JPS554600A - Defect detector for band - Google Patents

Defect detector for band

Info

Publication number
JPS554600A
JPS554600A JP7959379A JP7959379A JPS554600A JP S554600 A JPS554600 A JP S554600A JP 7959379 A JP7959379 A JP 7959379A JP 7959379 A JP7959379 A JP 7959379A JP S554600 A JPS554600 A JP S554600A
Authority
JP
Japan
Prior art keywords
band
defect detector
defect
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7959379A
Other languages
English (en)
Inventor
Zuitsuku Erubuin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Erwin Sick GmbH Optik Elektronik
Original Assignee
Erwin Sick GmbH Optik Elektronik
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Erwin Sick GmbH Optik Elektronik filed Critical Erwin Sick GmbH Optik Elektronik
Publication of JPS554600A publication Critical patent/JPS554600A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10—Scanning systems

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP7959379A 1978-06-23 1979-06-22 Defect detector for band Pending JPS554600A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2827705A DE2827705C3 (de) 1978-06-23 1978-06-23 Gerät zur Feststellung von Fehlern an Bahnmaterial

Publications (1)

Publication Number Publication Date
JPS554600A true JPS554600A (en) 1980-01-14

Family

ID=6042616

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7959379A Pending JPS554600A (en) 1978-06-23 1979-06-22 Defect detector for band

Country Status (6)

Country Link
US (1) US4295743A (ja)
JP (1) JPS554600A (ja)
DE (1) DE2827705C3 (ja)
FR (1) FR2429414A1 (ja)
GB (1) GB2025083A (ja)
SE (1) SE7905469L (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56129805A (en) * 1980-02-19 1981-10-12 Sick Optik Elektronik Erwin Defect detector for woven cloth

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3428435A1 (de) * 1984-08-01 1986-02-06 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Rauheitssonde
DE3629004A1 (de) * 1986-08-27 1988-03-10 Agie Ag Ind Elektronik Stromzufuehrung fuer eine drahtelektrode einer elektroerosionsmaschine
EP0303722B1 (de) * 1987-08-18 1992-07-01 Krauss u. Reichert GmbH + Co. KG Spezialmaschinenfabrik Verfahren und Vorrichtung zum Erfassen und Behandeln von Fehlern in Stoffbahnen
DE3734294A1 (de) * 1987-10-09 1989-04-27 Sick Optik Elektronik Erwin Optische oberflaechen-inspektionsvorrichtung
DE3739436C1 (de) * 1987-11-20 1989-03-30 Sick Optik Elektronik Erwin Optisches Lochsuchgeraet
DK0437883T3 (da) * 1990-01-16 1994-10-03 Philips Nv Skanderingsindretning til optisk skandering af en overflade langs en linie
DE4315105C1 (de) * 1993-05-06 1994-09-01 Sick Optik Elektronik Erwin Verfahren und Anordnung zum Winkeljustieren einer Linienabtastvorrichtung
GB2429764A (en) * 2005-08-30 2007-03-07 Imp College Innovations Ltd A scanning device using a first optical system with a first focal length and a second optical system with a second focal length

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL279098A (ja) * 1961-05-31
DE2433683C3 (de) * 1974-07-12 1979-02-22 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Vorrichtung zur Überwachung einer Materialbahn auf Fehlstellen
DE2508366C3 (de) * 1975-02-26 1979-05-17 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optische Vorrichtung mit einem Lichtvorhang
DE2532603C3 (de) * 1975-07-21 1978-12-14 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optische Vorrichtung zur Bestimmung des Lichtaustrittswinkels
DE2550815C3 (de) * 1975-11-12 1979-05-31 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optisches Abtastsystem
DE2727926C3 (de) * 1977-06-21 1980-11-13 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Vorrichtung zur Ermittlung von Fehlstellen auf der reflektierenden Oberfläche einer Bahn
DE2800351B2 (de) * 1978-01-04 1979-11-15 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optische Vorrichtung zur Bestimmung des Lichtaustrittswinkels bei einer mit einem Lichtfleck abgetasteten Materialbahn

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56129805A (en) * 1980-02-19 1981-10-12 Sick Optik Elektronik Erwin Defect detector for woven cloth

Also Published As

Publication number Publication date
FR2429414A1 (fr) 1980-01-18
DE2827705C3 (de) 1981-07-30
US4295743A (en) 1981-10-20
DE2827705B2 (de) 1980-12-11
DE2827705A1 (de) 1980-01-03
GB2025083A (en) 1980-01-16
SE7905469L (sv) 1979-12-24

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