JPS5536335U - - Google Patents
Info
- Publication number
- JPS5536335U JPS5536335U JP11888978U JP11888978U JPS5536335U JP S5536335 U JPS5536335 U JP S5536335U JP 11888978 U JP11888978 U JP 11888978U JP 11888978 U JP11888978 U JP 11888978U JP S5536335 U JPS5536335 U JP S5536335U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Apparatus For Radiation Diagnosis (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11888978U JPS6221969Y2 (cs) | 1978-08-30 | 1978-08-30 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11888978U JPS6221969Y2 (cs) | 1978-08-30 | 1978-08-30 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5536335U true JPS5536335U (cs) | 1980-03-08 |
| JPS6221969Y2 JPS6221969Y2 (cs) | 1987-06-04 |
Family
ID=29073660
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11888978U Expired JPS6221969Y2 (cs) | 1978-08-30 | 1978-08-30 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6221969Y2 (cs) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58115350A (ja) * | 1981-12-29 | 1983-07-09 | Nippon Atom Ind Group Co Ltd | 放射性固化体の均一性非破壊測定方法 |
| JP2011512226A (ja) * | 2008-02-22 | 2011-04-21 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 分散型線源によるｘ線イメージングのための高解像度の略静的セットアップ |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015161508A (ja) * | 2014-02-26 | 2015-09-07 | 日本装置開発株式会社 | Ｘ線検査装置およびｘ線検査装置の制御方法 |
| JP6933513B2 (ja) * | 2016-11-30 | 2021-09-08 | 住友化学株式会社 | 欠陥検査装置、欠陥検査方法、セパレータ捲回体の製造方法、及びセパレータ捲回体 |
-
1978
- 1978-08-30 JP JP11888978U patent/JPS6221969Y2/ja not_active Expired
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58115350A (ja) * | 1981-12-29 | 1983-07-09 | Nippon Atom Ind Group Co Ltd | 放射性固化体の均一性非破壊測定方法 |
| JP2011512226A (ja) * | 2008-02-22 | 2011-04-21 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 分散型線源によるｘ線イメージングのための高解像度の略静的セットアップ |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6221969Y2 (cs) | 1987-06-04 |